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Near-Surface Analysis of Semicondutor Using Grazing Incidence X-Ray Fluorescence

Published online by Cambridge University Press:  06 March 2019

Atsuo Iida ,
Kenji Sakurai  and
Yohichi Gohshi
Atsuo Iida
Affiliation:
Photon Factory, National Laboratory for High Energy Physics, Ohomachi, Tsukubagun, Ibarakiken 305, Japan
Kenji Sakurai
Affiliation:
Department of Industrial Chemistry, University of Tokyo Bunkyoku, Tokyo 113, Japan
Yohichi Gohshi
Affiliation:
Department of Industrial Chemistry, University of Tokyo Bunkyoku, Tokyo 113, Japan
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Summary

The X-ray external total reflection was used for the x-ray fluorescence analysis of the near surface layer of a GaAs wafer and a GaAlAs epilayer. Synchrotron radiation was used as an excitation source. The intensity ratio between the Ga K and As K fluorescence signals was measured as a function of the glancing angle. The reduction of As atoms near the surface of less than a hundred Å was observed for the high temperature annealed GaAlAs epilayer.

Type
VIII. Synchrotron Radiation and Other Applications of XRF
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 487 - 494
Copyright
Copyright © International Centre for Diffraction Data 1987

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References

1. Huang, T.C. and Parrish, W., Characterization of Thin Films by X-Ray Fluorescence and Diffraction Analysis, Adv. in X-Ray Anal. 22: 43 (1979)Google Scholar
2. It. Aiginger and Wobrauschek, P., Total reflectance X-Ray Spectrom.try, Adv. in X-Ray Anal. 28: 1 (1985)Google Scholar
3. lida, A., Yoshinaga, A., Salturai, K. and Gohshi, Y., Synchrotron Radiation Excited X-ray Fluorescence Analysis Using Total Reflection of X-Rays, Anal, Chem. 58: 394 (1986)Google Scholar
4. Eichinger, P., Characterization and Analysis of Detector Materials and Processes, Nucl. Instr. and Methods A253: 313 (1987)Google Scholar
5. lida, A., Sakurai, K., A.Yoshinaga and Gohshi, Y., Grazing Incidence X-Ray Fluorescence Analysis, Nucl. Instr. and Methods A246: 736 (1986)Google Scholar
6. Bloch, J.M., Sansone, M., Rondelez, F., Peiffer, D.G., Pincus, P., Kim, M.W. and Eiaenberger, P.M., Concentration Profile of a Dissolved Polymer near the Air-Liquid Interface: X-Ray Fluorescence Study, Phy. Rev. Lett. 54: 1039 (1985)Google Scholar
7. Usami, K., Mochizuki, Y., Minagawa, T., Iida, A. and Gohshi, Y., X-ray Fluorescence Analysis ofHg in SiO2 Filins Deposited by Hg- Sensitized Fhoto-C.D. Jpn. J. Appl. Phys. 25: 1449 (1986)Google Scholar
8. Haieh, J.J., Liquid-Phase Epitaxy, in “Handbook op Semiconductors”, volume 3, Keller, S.P. ed., North-Hoiland (1980)Google Scholar
9. Kudo, H., Ochiai, Y., Takita, K., Masuda, K. and Seki, S., Stoichiometry Measurements of GaAs by Means of 15-MeV He++ Backscattering, J. Appl. Phys. 50: 5034 (1979)Google Scholar
10. Tertian, R. and Claisse, F., “Principles of Quantitative X-Ray Fluorescence Analysis,” Heyden (1982)Google Scholar