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A New Focusing Vacuum X-Ray Macroprobe Analyzer

Published online by Cambridge University Press:  06 March 2019

James A. Dunne
James A. Dunne*
Affiliation:
Philips Electronic Instruments Mount Vernon, New York
*
*Present address: Jet Propulsion Laboratory, Pasadena, California.
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Abstract

A new X-ray probe attachment for the standard Norelco Vacuum Spectrograph has been developed. The X-ray optical design is essentially the same as that of the Norelco/AMR Microprobe goniometer, being an Ogilvie-type varying curvature Johann focusing device. A light optical system which allows the examination of the specimen during analysis is incorporated in a prealigned module along with the X-ray beam defining aperture. This arrangement assures a constant relationship between beam and optical field centers. Apertures ranging in diameter from 50–500 μ are provided. Data are presented giving the effective size of the specimen area analyzed using each of these apertures. A detailed description of the component parts of the instrument is given.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 8: Thirteenth Annual Conference on Applications of X-ray Analysis, August 12-14, 1964 , 1964 , pp. 223 - 230
Copyright
Copyright © International Centre for Diffraction Data 1964

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References

1. Adler, I., Axelrod, J., and Branco, J. J., “Further Applications of the Intermediate X-Ray Probe,” Advances in X-Ray Analysis, Vol. 2, University of Denver, Plenum Press, New York, 1958, pp. 167–173.Google Scholar
2. Thatcher, J. W. and Campbell, W. J., “Fluorescent X-Ray Spectrographic Probe-Design and Applications,” Rept. Invest. 5500, U.S. Bureau of Mines, College Park, Maryland, 1959, 23 pp.Google Scholar
3. Luke, C. L., “Ultratrace Analysis of Metals with a Curved-Crystal X-Ray Milliprobe,” Anal. Chem. 36:313–322, 1964.Google Scholar
4. Sloan, R. D., “X-Ray Spectro graphic Analysis of Thin Films by the Milliprobe Technique,” Advances in X-Ray Analysis, Vol. 5, University of Denver, Plenum Press, New York, 1962, pp. 512–515.Google Scholar
5. Heinrich, K. F. J., “X-Ray Probe with Collimation of the Secondary Beam,” Advances in X-Ray Analysis, Vol. 5, University of Denver, Plenum Press, New York, 1962, pp. 516–526.Google Scholar
6. Benin, E. P., “X-Ray Probe with Slit Aperture in the Secondary Beam,” Anal. Cheni. 36:441–443, 1964.Google Scholar