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A New High-Temperature Camera for Diffraction Studies Above 2200°C

Published online by Cambridge University Press:  06 March 2019

Michael Mantler
Affiliation:
Technical University Vienna, A-1040 Vienna, Austria
Horst Ebel
Affiliation:
Technical University Vienna, A-1040 Vienna, Austria
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Extract

The presented paper describes design and operational characteristics of a new high-temperature camera. The design is developed from the widely used Anton Paar camera, but several of its major disadvantages were eliminated.

The specimen is directly mounted on an electrically-heated metal strip. The most important improvement over the original camera is a provision for the compensation of the thermal expansion of the heating strip. Fig. 1 shows a Ta-heater after using it at temperatures above 2000°C without adequate compensation; the specimen, which is mounted at the center of the strip, is considerably displaced during the measurement and large errors occur in the measurement of the reflecting angles.

The improved overall design allows temperatures (at the heater) above 3000°C to be reached. The highest temperature measured so far at a tungsten strip was 3350°C, which is only 40° below its melting point.

Type
VIII. Advances in XRD Instrumentation and Procedures
Copyright
Copyright © International Centre for Diffraction Data 1986

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References

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