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Rapid Quantitative Analysis by X-Ray Spectrometry

Published online by Cambridge University Press:  06 March 2019

Robert D. Giauque  and
Joseph M. Jaklevic
Robert D. Giauque
Affiliation:
Lawrence Berkeley Laboratory, Univ. of Calif. Berkeley, California 94720
Joseph M. Jaklevic
Affiliation:
Lawrence Berkeley Laboratory, Univ. of Calif. Berkeley, California 94720
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Abstract

An x-ray fluorescence analysis method applicable to the case of fluorescent spectra excited with monoenergetic x-rays has been developed. The technique employs a minimum number of calibration steps using single element thin film standards and depends upon theoretical cross sections and fluorescent yield data to interpolate from element to element. The samples are treated as thin films and corrections for absorption effects are easily determined- Enhancement effects, if not negligible, are minimized by sample dilution techniques or by selective excitation.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 15: Twentieth Annual Conference on Applications of X-ray Analysis, August 11-13, 1971 , 1971 , pp. 164 - 175
Copyright
Copyright © International Centre for Diffraction Data 1971

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