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X-Ray Fluorescence Analysis of Geological Materials Using Rousseau's Fundamental Algorithm

Published online by Cambridge University Press:  06 March 2019

R. G. Johnson
R. G. Johnson*
Affiliation:
U.S. Geological Survey, National Center 957, Reston, Virginia 22092
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Extract

The analysis of many types of geological samples by X- ray fluorescence (XRF) spectroscopy has become routine. For example, the analysis of major elements in silicate rocks is not a problem because of the large number of standard reference materials available, and because of the benefits of the fusion preparation. Even simple linear regression analysis provides accurate results when standards and samples are similar.

Type
III. XRF Fundamental Parameters and Data Analysis
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 105 - 112
Copyright
Copyright © International Centre for Diffraction Data 1986

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References

1. Abbey, Sydney, Studies in “standard samples” of silicate rocks and minerals: 1969-1982, Geological Survey of Canada, Paper 83-15 (1983).Google Scholar
2. Taggart, J.E. and Wahlberg, J.S., A New in-muffle automatic fluxer design for casting glass discs for X-ray fluorescence analysis, 7th Conference of the Federation of Analytical Chemistry and Spectroscopy Societies, Philadelphia, paper 327a (1980).Google Scholar
3. Taggart, J.E. and Wahlberg, J.S., New mold design for casting fused samples, in; “Advances in X∼Ray Analysis Vol. 23, 11 Plenum Press, New York (1980).Google Scholar
4. Criss, J.W., Fundamental parameters calculations on a laboratory computer, in: “Advances in X-Ray Analysis Vol. 23”, Plenum Press, New York (1980).Google Scholar
5. Criss, J.W. and Birks, L.S., Calculation methods for fluorescent Xray spectrometry, Anal. Chem., 40: 1080 (1968).Google Scholar
6. Tao, G.Y., Pella, P.A., and Rousseau, R.M., NBSGS C. A Fortran. Program for quantitative X-ray fluorescence analysis, NBS. echnical Note 1213 (1985).Google Scholar
7. Tertian, R. and Claisse, F., “Principles of Quantitative X-Ray Fluorescence Analysis”, Heyden & Sons, London (1982).Google Scholar
8. Rousseau, R.M., Fundamental algorithm between concentration and intensity in XRF. Analysis: 1-Theory, X-Ray Spectrom., 13: 115 (1984).Google Scholar
9. Rousseau, R.M., Fundamental algorithm between concentration and intensity in XRF. Analysis: 2-Practical Application, X-Ray Spectrom,, 13: 121 (1984).Google Scholar
10. Rousseau, R.M., Fundamental algorithm between concentration and intensity in XRF. Analysis: 3-Experimental Verification, X-Ray Spectrom., 14: 207 (1986).Google Scholar
11. Sherman, J., The theoretical derivation of X-ray intensity from mixtures, Spectrochim, Acta, 7: 283 (1955).Google Scholar
12. Lachance, G.R. and Traill, R., Can. Spectrosc., 11: 43 (1966).Google Scholar
13. Claisse, F. and Quintin, M., Can, Spectrosc, 12: 129 (1967).Google Scholar
14. Johnson, R.G. and Rait, N., Fusion of massive sulfides for X-ray fluorescence analysis, Chem. Geol. (submitted).Google Scholar
15. Loomis, T.C. and Keith, H.D., Spectral distributions for X-rays produced by a General Electric EA. 5 Cr/W. ube at various applied constant voltages, X-Ray Spectrom., 5: 104 (1976).Google Scholar
16. Certificate of Analysis, Instituto de Pesquisas Tecnologicas do Estado de Sao Paulo S. A.Google Scholar
17. Certificate of Analysis, Office of standard Reference Materials, National Bureau of Standards, Washington D. C.Google Scholar
18. Certificate of Analysis, Canada Centre for Mineral and Energy Technonogy, Ottawa, Canada.Google Scholar