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X-Ray Fluorescence Analysis of Stainless Steels and Low Alloy Steels Using Secondary Targets and the Exacta) Program

Published online by Cambridge University Press:  06 March 2019

J. C. Harmon
Affiliation:
Shell Development Company Houston, Texas
G.E.A. Wyld
Affiliation:
Shell Development Company Houston, Texas
T. C. Yao
Affiliation:
Shell Development Company Houston, Texas
J. W. Otvos
Affiliation:
Shell Development Company Houston, Texas
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Abstract

Exact is a mini-computer based fundamental parameters program which is utilized for matrix corrections in energy-dispersive X-ray analyses. We have previously shown this technique to work well with radioactive sources. However, due to the limited selection of isotopic sources available and their inherent low X-ray flux, we have investigated the use of Fe, Sn, and Dy secondary-targets as sources of monochromatic X-rays. Results to date indicate that the secondary-targets provide X-ray radiation which has sufficient monochromaticity for our technique to remain valid.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1978

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Footnotes

b)

Author to whom correspondence should be sent.

c)

Present address: Kevex Corporation, Foster City, Ca.

d)

Present address: University of California, Lawrence Berkeley Laboratory, Berkeley, California 94720

a)

Energy-Dispersive X-Ray Analysis Computation Technique.

References

1. Lachance, G. R. and. Traill, R. J., “A Practical Solution To The Matrix Problem in X-Ray Analysis”, Can. Spectry., 11, 43 (1966).Google Scholar
2. Claisse, F. and Quintin, M., “Generalization of The Lachance-Traill Method for The Correction of The Matrix Effect in X-Ray Fluorescence Analysis”, Can. Spectry., 12, 129 (1967).Google Scholar
3. Rasberry, S. D. and. Heinrich, K. F. J., “Calibration For Interelement Effects in X-Ray Fluorescence Analysis”, Anal. Chem., 46, 81 (1974).Google Scholar
4. Locas Tooth, H. J. and Pyne, C., “The Accurate Determination of Major Constituents by X-Ray Fluorescence Analysis in The Presence of Large Interelement Effects”, Advances In X-Ray Analysis, 7, 523(1964).Google Scholar
5. Gillman, E. and Heal, H. T., “Some Problems in The Analysis of Steels by X-Ray Fluorescence”, Brit. J. Appl. Phys., 3, 353 (1952).Google Scholar
6. Sherman, J., “The Theoretical Derivation of Fluorescent X-Ray Intensities from Mixtures”, Spectrochimics Acta, 7, 283 (1955).Google Scholar
7. Shlrawiwa, T. and Fujino, N., “Theoretical Calculations of Fluorescent X-Ray Intensities in Fluorescent X-Ray Spectrometric Analysis”, Jap. J. Appl. Phys., 5, 886 (1966).Google Scholar
8.. Criss, J. W. and Birks, L. S., “Calculation Methods for Fluorescent X-Ray Spectrometry”, Anal. Chem., 40, 1080 (1968).Google Scholar
9. Gardner, R. P., Wielopolski, L., and Doster, J. M. , “Adaptation of The Fundamental Parameters Monte Carlo Simulation to EDXRF Analysis With Secondary Fluorescer X-Ray Machines”, Advances in X-Ray Analysis, 21, 129(1977).Google Scholar
10. Otvos, J. W., Wyld, G., and Yao, T. C., “Fundamental Parameter Method for Quantitative Elemental Analysis with Monochromatic X-Ray Sources”, 25th Annual Denver X-Ray Conference, 1976.Google Scholar
11. Bracewell, B., and Veigele, W. J., “Devel, In Appl. Spec.”, 9, 357400 (1971).Google Scholar
12. Fink, R. W. and Ras, P. V., “Handbook of Spec.”, Vol. 1, pp. 219223, CRC Press, Cleveland, Ohio (1974).Google Scholar
13. Birks, L. S., “Handbook of Spec.” Vol. 1, pp. 230, CRC Press, Cleveland, Ohio (1974).Google Scholar