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Application of ODF to the Rietveld Profile Refinement of Polycrystalline Solid

Published online by Cambridge University Press:  06 March 2019

C. S. Choi ,
E. F. Baker  and
J. Orosz
E. F. Baker
Affiliation:
Energetics and Warheads Division, ARDEC Picatinny Arsenal, NJ 07806
J. Orosz
Affiliation:
Energetics and Warheads Division, ARDEC Picatinny Arsenal, NJ 07806
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Extract

The Rietveld profile refinement method is probably the most popular technique used for the crystallographic characterization of materials including crystal structures and phase analysis, but it has been used mostly with ideal powder sample, not with textured polycrystals, because effects of strong and complex textures. Most technological materials are fabricated by using thermo-mechanical forming processes, which inevitably produce strong and complex preferential orientations of the crystallites. Consequently, the diffraction patterns of a given technological material are not unique but vary considerably with the measuring direction, with intensity variations as large as factors of hundreds, depending on the degree of texture. The texture effect on the diffraction pattern of a certain sample direction is directly proportional to the pole density of the corresponding inverse pole figure, which can be obtained from the three-dimensional orientation distribution function (ODF) of the material. The ODFs of materials with high crystal symmetry, such as cubic, hexagonal, tetragonal, and orthorhombic, can be determined quite precisely, using modern texture analysis techniques (for example, Bungel, Wenk, and Kallend et al.). The pole density distributions of the inverse pole figures can be used in the diffraction profile calculation of a highly textured sample.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 49 - 57
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

1 Bunge, H. J.. “Texture Analysis in Materials Science, Mathematical Methods”, Butterworth & Co., London (1982).Google Scholar
2 “Preferred Orientation in Deformed Metals and Rocks”, edited by H.-R., Wenk, Academic Press, New York, (1985).Google Scholar
3 Proc, “8th Int . Conf. on Textures of Materials “, edited by Kall, J. S. end and G., Gottstein, The Metallugical Society, Inc., Warrendale, PA, (1988).Google Scholar
4 S., Matthies and Vinel, G. W., “On the Reproduction of the Orientation Distribution Function of Texturized Samples from Reduced Pole Figures using the Conception of a Conditional Gost Correction”, Phys. Status Solidi, B112, 111–120 (1982).Google Scholar
5 Kallend, J. S., Kocks, U. F., Rollett, A. D., and H.-R., Wenk, “OperaLional Lex Lure analysis“, MaL. Sci. Eny., A132:1 (1991).Google Scholar
6 Rietveld, H. M., “A profile refinement method for nuclear and magnetic structures”, J. Appl. Cryst., 2:65 (1969).Google Scholar
7 G., Caglioti, A., Paoletti, and Ricci, F. P., “Choice of Collimators far a Crystal Spectrometer for Neutron Diffraction”, Nucl. Instrum. Methods, 3, 223–228 (1958).Google Scholar
8 Hill, R. J., and Howard, C. J., “Quantitative Phase Analysis from Neutron Powder Diffraction Data Using the Rietveld Method”, J. Appl. Cryst., 1987, (467–474)Google Scholar
9 J., Rodriguez-Carvajal, Program FULLPROF, Version Feb90, Institut Laue-Langevin, Grenoble, France.Google Scholar