Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-18T01:17:47.962Z Has data issue: false hasContentIssue false
  • English
  • Français

Elemental and Phase Mapping of Sputtered Binary Plutonium Alloys

Published online by Cambridge University Press:  06 March 2019

P. L. Wallace ,
W. L. Wien ,
H. F. Rizzo ,
A. W. Echeverria  and
R. P. Goehner
P. L. Wallace
Affiliation:
Lawrence Livermore National Laboratory Livermore, Calif.
W. L. Wien
Affiliation:
Lawrence Livermore National Laboratory Livermore, Calif.
H. F. Rizzo
Affiliation:
Lawrence Livermore National Laboratory Livermore, Calif.
A. W. Echeverria
Affiliation:
Lawrence Livermore National Laboratory Livermore, Calif.
R. P. Goehner
Affiliation:
Madison, Wis.
Get access

Abstract

In this article, we demonstrate that the combination of elemental and phase mapping is a very powerful tool for characterizing sputtered, binary plutonium alloys.

A specially designed energy-dispersive spectrometer equipped with an automated x-y translational stage was used to measure elemental differences in several disks sputter-coated with binary plutonium alloys. Automated diffractometer scans were obtained from selected areas on the disks by using specially designed sample holders. The elemental differences were then correlated with the phases present and the observed corrosion resistance. The elemental spectra and diffractometer scans were analyzed using a modified version of the SPECPLOT program. This program enables the user to analyze both energy-dispersive elemental data and diffractometer data using a single program.

Type
I. Microbeam Techniques and Imaging Methods for Materials Characterization
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 87 - 92
Copyright
Copyright © International Centre for Diffraction Data 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Rizzo, H. F. and Echeverria, A.W., Formation of Am orphous Alloys or Metastable Structures in Pu-Fe, Pu-Ta, and Pu -Si Alloys, J. Less-Common Metals, 121: 469 (1986).Google Scholar
2. Rizzo, H.F., Echeverria, A.W., Wien, V.V.L., and Massalski, T.B., Formation of Metastable Structures and Amo rph ou s Phases in Pu-Based Systems Using the Triode Sputtering Technique, presented at the Sixth International Conference on Rapidly Quenched Materials, August 3-7, 1987. To be published in Mater. Sci, Eng.Google Scholar
3. Wallace, P.L., Hosmer, P.K., Walden, J. C., and Haugen, W.L., The Direct Measurement of Ga in Binary Pu -Ga Alloys Using X-ray Spectrometric Techniques, X-ray Spectrom., 7 (4):212 (1978).Google Scholar
4. Criss, J.W., Fundamental-Parameters Calculations on a Laboratory Microcomputer, in “Advances in X-ray Analysis”, 23:87, Plenum Publishing Corp., New York (1980). XRF-11 is confidential, unpublished computer software owned by Criss Software, Inc., 12204 Blaketon Street, Largo, M D 20722 (Copyright 1984),Google Scholar
5. Goehrer, R.P., Specplot An Interactive Data Reduction and Display Program for Spectral Data, in “Advances in X-ray Analysis”, 23:305, Plenum Publishing Corp., New York (1380).Google Scholar
6. Hatfield, W.T., Goehner, R.P., and Lifshin, E, The General Electric Laboratory Automation System, in “Computer Networks in the Ch emical Laboratory”, Levy, G. C. and Terpstra, D., Eds., John Wiley & Sons, New York (1981).Google Scholar
7. Goehrer, R. p., private communication regarding “ Specplot User Manual”, a General Electric internal document (1977).Google Scholar
8. Wallace, P.L., Shimamoto, F.Y., and Quick, T.M., Large-scale Automation of the Lawrence Livermore Laboratory X-ray Analytical Facilities, Lawrence Livermore National Laboratory, Livermore, C A , Rept, UCRL-52953 (1980).Google Scholar