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ON THE PROPERTIES OF THE t- AND F-RATIOS IN LINEAR REGRESSIONS WITH NONNORMAL ERRORS

Published online by Cambridge University Press:  01 August 2004

Huaizhen Qin  and
Alan T.K. Wan
Huaizhen Qin
Affiliation:
Peking University
Alan T.K. Wan
Affiliation:
City University of Hong Kong
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Abstract

In this paper we derive the necessary and sufficient conditions for the t-ratio to be Student's t distributed. In particular, it is demonstrated for a special case that under conditions of nonnormality characterized by elliptical symmetry, the t-ratio remains Student's t distributed provided that the random vector forming the t-ratio has a diagonal covariance structure. Our results also show that the findings of Magnus (2002, in A. Ullah, A.T.K. Wan, & A. Chaturvedi (eds.), Handbook of Applied Econometrics and Statistical Inference, 277–285) on the sensitivity of the t-ratio remain invariant in the elliptically symmetric distribution setting. Extension to the linear model is considered. Exact results giving finite sample justification for the t-statistic under nonnormal error terms are derived. Furthermore, the distribution of the F-ratio assuming elliptical errors is examined. Our results reject the argument by Zaman (1996, Statistical Foundations for Econometric Techniques) that nonnormality of disturbances has in general no effect on the F-statistic.The authors thank Anurag Banerjee, Judith Clarke, Kazuhiro Ohtani, and Guohua Zou for their helpful suggestions and advice during the course of this work. In particular, we are very grateful to Judith Clarke for bringing to our attention the unpublished work of D.H. Thomas and to Guohua Zou for his careful reading of an earlier version of this paper. Thanks also go to the co-editor Benedikt Pötscher and two anonymous referees for their valuable comments. The second author gratefully acknowledges financial support from the Hong Kong Research Grant Council.

Type
Research Article
Information
Econometric Theory , Volume 20 , Issue 4 , August 2004 , pp. 690 - 700
Copyright
© 2004 Cambridge University Press

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