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Reliability of photovoltaic modules based on climaticmeasurement data

Published online by Cambridge University Press:  19 April 2010

R. Laronde ,
A. Charki  and
D. Bigaud
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Abstract

In the building domain, components or equipment are often subjected to severeenvironmental conditions. In order to predict the reliability and the life-time of suchequipment, accelerated life testing can be carried out. Severe conditions are applied toaccelerate the ageing of the components and the reliability at nominal conditions is thendeduced considering that these nominal conditions are not constant but stochastic. In thispaper, the accelerated life testing of photovoltaic modules is carried out at severemodule temperature levels. The module power losses are monitored and the limit state isdetermined when a threshold power is reached. The stochastic data and the reliability aresimulated during a period of twenty years. Finally, the life time of the component isevaluated.

Keywords

Life-timeaccelerated life testingmalfunctioningreliability lawstochasticphotovoltaic module
Type
Research Article
Information
International Journal of Metrology and Quality Engineering , Volume 1 , Issue 1 , 2010 , pp. 45 - 49
Copyright
© EDP Sciences 2010

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References

I. Tsuda, S. Igari, K. Nakahara, K. Takahisa, K. Morita, H. Kato, Long term reliability evaluation of PV module, in 3rd World Conference on Photovoltaic Energy Conversion (2003), pp. 1960–1963
Vázquez, M., Rey-Stolle, I., Prog. Photovolt. Res. Appl. 16, 419 (2008) CrossRef
J.H. Wohlgemuth, D.W. Cunningham, M. Nguyen, J. Miller, Long term reliability of PV modules, in 20th European Photovoltaic Solar Energy Conference (2005), pp. 1942–1946
S. Voiculescu, F. Guerin, M. Barreau, A. Charki, A. Todoskoff, Reliability estimation in random environment: Different approaches, RAMS 2007 (2007), pp. 202–207
W.B. Nelson, Accelerated Testing: Statistical Models, Test Plans and Data Analyses (Wiley-Interscience, 1990)
F. Guerin, P. Lantieri, B. Dumon, Applying accelerated life models to halt testing, in 9th ISSAT International Conference on Reliability and Quality Design (2003)
Voiculescu, S., Guerin, F., Barreau, M., Charki, A., Int. J. Product Development 7, 246 (2009) CrossRef
Kenny, R.P., Dunlop, E.D., Ossenbrink, H.A., Müllejans, H., Prog. Photovolt. Res. Appl. 14, 155 (2006) CrossRef
IEC 61215, Crystalline silicon terrestrial photovoltaic (PV) modules – Design qualification and type approval (2005)
IEC 61725, Analytical expression for daily solar profiles (1997)
Compère, P., Revue de Statistique Appliquée 45, 21 (1997)