Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-24T08:57:19.480Z Has data issue: false hasContentIssue false
  • English
  • Français

Analysis of the electromagnetic wave illumination on the transmission lines with nonlinear terminations

Published online by Cambridge University Press:  08 March 2021

Z. Seifi Open the ORCID record for Z. Seifi [Opens in a new window] ,
A. Ghorbani Open the ORCID record for A. Ghorbani [Opens in a new window]  and
A. Abdipour Open the ORCID record for A. Abdipour [Opens in a new window]
Z. Seifi
Affiliation:
Department of Electrical Engineering, Amirkabir University of Technology, Hafez Ave., Tehran, Iran
A. Ghorbani*
Affiliation:
Department of Electrical Engineering, Amirkabir University of Technology, Hafez Ave., Tehran, Iran
A. Abdipour
Affiliation:
Department of Electrical Engineering, Amirkabir University of Technology, Hafez Ave., Tehran, Iran
*
Author for correspondence: A. Ghorbani, E-mail: ghorbani@aut.ac.ir
Get access Rights & Permissions [Opens in a new window]

Abstract

In this paper, an unconditionally stable time-domain method is proposed to investigate the external electromagnetic (EM) field illumination on the nonlinearly loaded transmission lines. In the proposed algorithm, the field to line coupling equations and linear/nonlinear boundary conditions are incorporated and expressed in a matrix form. The derived differential matrix equations are then discretized and solved using the proposed finite difference time domain (FDTD) method approach. The discretized nonlinear matrix equations are also solved by applying a globally convergent iterative method to ensure the stability of the method. Moreover, the experimental investigations are conducted using a transverse EM (TEM) cell for a single microstrip line and a power detector circuit as a nonlinearly loaded transmission line to confirm the accuracy and stability of the proposed method. With the merit of satisfactory accuracy and unconditional stability for the entire range of time steps, the presented approach would be applicable for analyzing the microwave linear/nonlinear circuits subjected to the external incident EM wave.

Keywords

Finite-difference time-domain methodincident electromagnetic (EM) wavenonlinearly loaded transmission linepower detector circuit-microwave linear/nonlinear circuitstransverse electromagnetic (TEM) cellunconditionally stable method
Type
Electromagnetic Compatibility
Information
International Journal of Microwave and Wireless Technologies , Volume 14 , Issue 1 , February 2022 , pp. 43 - 53
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press in association with the European Microwave Association

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Bäckström, M and Lövstrand, KG (2004) Susceptibility of electronic systems to high power microwaves: summary of test experience. IEEE Transactions on Electromagnetic Compatibility 46, 396–403.CrossRefGoogle Scholar
Ott, HW (2009) Electromagnetic Compatibility Engineering. Hoboken, New Jersey: John Wiley & Sons.CrossRefGoogle Scholar
Tesche, FM, Ianoz, M and Karlsson, T (1997) EMC Analysis Methods and Computational Models. New York: Wiley Interscience.Google Scholar
Leone, M, Bruns, H and Singer, H (1998) Fast EMC analysis for printed circuit boards using an equivalent-wire Method of Moments. Int. Symp. EMC’98, Rome, Italy, pp. 7–12.Google Scholar
Paul, CR (1994) Analysis of Multiconductor Transmission Lines. New York: John Wiley & Sons.Google Scholar
Rizzoli, V, Costanzo, A and Monti, G (2004) General electromagnetic compatibility analysis for nonlinear microwave integrated circuits. Proc. IEEE MTT-S Int. Microw. Symp. Dig., Fort Worth, TX, USA, June, vol. 2, pp. 953–956.CrossRefGoogle Scholar
Zhang, C and Wang, H (2015) Experiment and simulation of the nonlinear and transient responses of GaAs PHEMT injected with microwave pulses. IEEE Transactions on Electromagnetic Compatibility 57, 1132–1138.CrossRefGoogle Scholar
Orlandi, A and Paul, CR (1996) FDTD Analysis of lossy multiconductor transmission lines terminated in arbitrary loads. IEEE Transactions on Electromagnetic Compatibility 38, 388–399.CrossRefGoogle Scholar
Namiki, T (1999) A new FDTD algorithm based on alternating-direction implicit method. Transactions on Microwave Theory and Techniques 47, 2003–2007.CrossRefGoogle Scholar
Sun, G and Trueman, CW (2006) Efficient implementations of the Crank–Nicolson scheme for the finite-difference time-domain method. IEEE Transactions on Microwave Theory and Techniques 54, 2275–2284.Google Scholar
Nitsch, D, Camp, M, Sabath, F, Haseborg, JLT and Garbe, H (2004) Susceptibility of some electronic equipment to HPEM threats. IEEE Transactions on Electromagnetic Compatibility 46, 380–389.CrossRefGoogle Scholar
Agrawal, AK, Price, HJ and Gurbaxani, SH (1980) Transient response of multiconductor transmission lines excited by a nonuniform electromagnetic field. IEEE Transactions on Electromagnetic Compatibility EMC-22, 119–129.CrossRefGoogle Scholar
Kantartzis, VN and Tsiboukis, TD (2008) Modern EMC analysis techniques volume I: time-domain computational schemes. Synthetic Lectures Computational Electromagnetics 3, 1–224.Google Scholar
Antognetti, P and Massobrio, G (1993) Semiconductor Device Modeling with SPICE, 2nd Edn. New York: McGraw-Hill.Google Scholar
Kelley, CT (2003) Solving Nonlinear Equations With Newton's Method. Philadelphia, PA: SIAM.CrossRefGoogle Scholar
Leone, M and Singer, HL (1999) On the coupling of an external electromagnetic field to a printed circuit board trace. IEEE Transactions on Electromagnetic Compatibility 41, 418–424.CrossRefGoogle Scholar
Seifi, Z, Abdipour, A and Mirzavand, R (2015) Distributed signal and noise modeling of millimeter wave transistor based on CMOS technology. Applied Computational Electromagnetics Society Journal 30, 915–921.Google Scholar
Crawford, ML and Workman, JL (1979) Using A TEM Cell for EMC Measurements of Electronic Equipment. Boulder, Colorado: U.S. Department of Commerce.Google Scholar
Garcia, SG, Lee, TW and Hagness, SC (2002) On the accuracy of the ADI-FDTD method. IEEE Antennas Wireless Propagation Letters 1, 31–34.CrossRefGoogle Scholar