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Combustion Synthesis and Spectra Characteristic of Gd2O2S:Tb3+ and La2O2S:Eu3+ X-ray Phosphors

Published online by Cambridge University Press:  03 March 2011

Tian Xia ,
Wang-He Cao ,
Xi-Xian Luo  and
Ying Tian
Tian Xia*
Affiliation:
Opto-Electronic Technology Institute, Dalian Maritime University, Liaoning Dalian 116026, People’s Republic of China
Wang-He Cao
Affiliation:
Opto-Electronic Technology Institute, Dalian Maritime University, Liaoning Dalian 116026, People’s Republic of China
Xi-Xian Luo
Affiliation:
Opto-Electronic Technology Institute, Dalian Maritime University, Liaoning Dalian 116026, People’s Republic of China
Ying Tian
Affiliation:
Opto-Electronic Technology Institute, Dalian Maritime University, Liaoning Dalian 116026, People’s Republic of China
*
a) Address all correspondence to this author. e-mail: xthd80@163.com.
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Abstract

X-ray phosphors of Gd2O2S:Tb3+ and La2O2S:Eu3+ were synthesized by combustion reactions. The samples were characterized by x-ray diffraction (XRD), scanning electronic microscope (SEM), photoluminescence (PL), and x-ray excited luminescence (XEL) spectra. XRD results revealed pure oxy-sulfide phases when the sintering temperatures were no more than 500 °C, and the mean particle sizes were about 20 nm. While the sintering temperatures became higher, oxy-sulfate phases were present. SEM results illustrated a loose, porous agglomeration and a continuous three-dimensional network structure; PL spectra showed the characteristic emission of rare-earth activation ions. To our satisfaction, the PL intensities were nearly the same as some commercial x-ray phosphors. XEL spectra revealed the same characteristic emission, although their luminescence principles were different from those of the PL spectra. In addition, because absorption coefficients of these samples for x-ray and doped concentrations doped of activation ions were different, their light emission intensities and efficiencies also varied.

Keywords

Combustion synthesis
Type
Articles
Information
Journal of Materials Research , Volume 20 , Issue 9 , September 2005 , pp. 2274 - 2278
Copyright
Copyright © Materials Research Society 2005

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