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Crystallography of YBa2Cu3O6+x thin film-substrate interfaces

Published online by Cambridge University Press:  31 January 2011

Lisa A. Tietz ,
C. Barry Carter ,
Daniel K. Lathrop ,
Stephen E. Russek ,
Robert A. Buhrman  and
Joseph R. Michael
Lisa A. Tietz
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853
C. Barry Carter
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853
Daniel K. Lathrop
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853
Stephen E. Russek
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853
Robert A. Buhrman
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853
Joseph R. Michael
Affiliation:
Homer Research Laboratory, Bethlehem Steel Corporation, Bethlehem, Pennsylvania 18016
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Abstract

The epitactic nature of the growth of YBa2Cu3O6+x (YBCO) superconducting thin films on ceramic substrates has been studied using high-resolution electron microscopy (HREM) and selected-area diffraction (SAD) of cross-sectional specimens. The films were grown in situ on (001)-oriented MgO and (001)-oriented Y2O3-stabilized cubic ZrO2 (YSZ) single-crystal substrates by electron beam evaporation. Both of these materials have large lattice misfits with respect to YBCO. Different orientation relationships were observed for films grown on the two types of substrates. These orientation relationships are shown to provide the best matching of the oxygen sublattices across the substrate-film interfaces. A crystalline intermediate layer, 6 nm thick, between the YBCO film and YSZ substrate was observed by HREM and shown by EDS to be a Ba-enriched phase, possibly barium zirconate formed by a reaction. In contrast, the YBCO–MgO interface was found to be sharp and free of any intermediate layers.

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Articles
Information
Journal of Materials Research , Volume 4 , Issue 5 , October 1989 , pp. 1072 - 1081
Copyright
Copyright © Materials Research Society 1989

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