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Deposition of rare earth tantalate buffers on textured Ni-W substrates for YBCO coated conductor using chemical solution deposition approach

Published online by Cambridge University Press:  01 March 2006

M.S. Bhuiyan ,
M. Paranthaman ,
A. Goyal ,
L. Heatherly  and
D.B. Beach
M.S. Bhuiyan*
Affiliation:
Chemical Sciences Divison, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6100
M. Paranthaman
Affiliation:
Chemical Sciences Divison, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6100
A. Goyal
Affiliation:
Metals and Ceramics Divison, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6116
L. Heatherly
Affiliation:
Metals and Ceramics Divison, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6116
D.B. Beach
Affiliation:
Chemical Sciences Divison, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6100
*
a) Address all correspondence to this author. e-mail: s9r@ornl.gov
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Abstract

Epitaxial films of rare-earth (RE = La, Ce, Eu, and Gd) tantalates, RE3TaO7 with pyrochlore structures were grown on biaxially textured nickel-3 at.% tungsten (Ni-W) substrates using chemical solution deposition (CSD) process. Precursor solution of 0.3∼0.4 M concentration of total cations were spin coated on to short samples of Ni-W substrates and the films were crystallized at 1050∼1100 °C in a gas mixture of Ar- 4% H2 for 15 to 60 min. X-ray studies show that the films of pyrochlore RE tantalate films are highly textured with cube-on-cube epitaxy. Improved texture was observed in case of lanthanum tantalate (La3TaO7) film grown on Ni-W substrates. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) investigations of RE3TaO7 films reveal a fairly dense and smooth microstructure without cracks and porosity. The rare-earth tantalate layers may be potentially used as buffer layers for YBa2Cu3O7-δ (YBCO) coated conductors.

Keywords

Barrier layerSolution depositionTexture
Type
Articles
Information
Journal of Materials Research , Volume 21 , Issue 3 , March 2006 , pp. 767 - 773
Copyright
Copyright © Materials Research Society 2006

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