Hostname: page-component-cd9895bd7-gxg78 Total loading time: 0 Render date: 2024-12-23T16:35:07.807Z Has data issue: false hasContentIssue false

Fabrication of mesoporous CdS nanorods by chemical etching

Published online by Cambridge University Press:  31 January 2011

Lin Yang
Affiliation:
Structure Research Laboratory, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China
Jian Yang
Affiliation:
Structure Research Laboratory and Department of Chemistry, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China
Zheng-Hua Wang
Affiliation:
Structure Research Laboratory, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China
Jing-Hui Zeng
Affiliation:
Structure Research Laboratory and Department of Chemistry, University of Science zand Technology of China, Hefei, Anhui 230026, People's Republic of China
Li Yang
Affiliation:
Department of Chemistry, University of Science and Technology of China, Hefi, Anhui 230026, People's Republic of China
Yi-Tai Qian
Affiliation:
Structure Research Laboratory and Department of Chemistry, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China
Get access

Abstract

One-dimensional CdS nanocrystallites were used as precursors for preparation of mesoporous CdS nanorods through an ion-exchange process at room temperature. The results from x-ray photoelectron spectroscopy, transmission electron microscopy, energy-dispersive x-ray analysis, and x-ray powder diffraction techniques showed that Ag+ did not affect the electronic structure of CdS or cause the disorder of crystal structure although the product contained a considerable amount of Ag2S. The visible absorption of Ag2S nanoparticles in the mesoporous structure led to the result that the intensities of Raman scattering peaks of the mesoporous nanorods were weaker than those of CdS initial nanorods.

Type
Articles
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Ahmadi, T.S., Wang, Z.L., Green, T.C., Henglein, A., Elsayed, M.A., Science 272, 1924 (1996); W.U. Huynh, X.G. Peng, and A.P. Alivisatos, Adv. Mater. 11, 923 (1999); H. Mattoussi, L.H. Radzilowski, B.O. Dabbousi, E.L. Thomas, M.G. Bawendi, and M.F. Rubner. J. Appl. Phys. 83, 7965 (1998).CrossRefGoogle Scholar
Peng, X.G., Manna, L., Yang, W.D., Wickham, J., Scher, E., Kadavanich, A., and Alivisatos, A.P., Nature 404, 59 (2000);Google Scholar
Morales, A.M. and Lieber, C.M., Science 279, 208 (1998).Google Scholar
Mulvaney, P., Liz-Marzan, L.M., Giersig, M., Ung, T., J. Mater. Chem. 10, 1259 (2000); H. Wang, Y. Zhu, and P.P. Ong, J. Appl. Phys. 90, 964 (2001); D.I. Gittins and F. Caruso, J. Phys. Chem. B 105, 6846 (2001).CrossRefGoogle Scholar
Coleman, N.R.B., Morris, M.A., Spalding, T.R., and Holmes, J.D., J. Am. Chem. Soc. 123, 187 (2001); P.M. Jayaweera, S.S. Palayangoda, and K. Tennakone, J. PhotoChem. PhotoBio. A 140, 173 (2001);CrossRefGoogle Scholar
Chang, J.S., Park, S.E., Gao, Q.M., Ferey, G. and Cheetham, A.K., Chem. Commun. 9, 859 (2001).CrossRefGoogle Scholar
Attard, G.S., Glyde, J.C., and Goltner, C.G., Nature 378, 366 (1995); D. Antonelli and J.Y. Ying, Angew. Chem. Int. Ed. Engl. 35, 426 (1996).CrossRefGoogle Scholar
Braun, P.V., Osenar, P., Tohver, V., Kennedy, S.B., and Stupp, S.I., J. Am. Chem. Soc. 121, 7302 (1999); V. Tohver, P.V. Braun, M.U. Pralle, and S.I. Stupp, Chem. Mater. 9, 1495 (1997);CrossRefGoogle Scholar
Braun, P.V., Osenar, P., and Stupp, S.I.. Nature 380, 325 (1996).CrossRefGoogle Scholar
MacLachlan, M.J., Coombs, N., Bedard, R.L., White, S., Thompson, L.K., and Ozin, G.A., J. Am. Chem. Soc. 121, 12005 (1999); K.K. Rangan, P.N. Trikalitis, and M.G. Kanatzidis. J. Am. Chem. Soc. 122, 10230 (2000).CrossRefGoogle Scholar
Sauer, J., Marlow, F., Spliethoff, B., and Schüth, F., Chem. Mater. 14, 217 (2002).CrossRefGoogle Scholar
Tenne, R. and Nabutovsky, V.M., Solid State Commun. 82, 651 (1992).CrossRefGoogle Scholar
Sebastian, P.J. and Calixto, M.E., Thin Solid Films. 360, 128 (2000).CrossRefGoogle Scholar
Kumar, A. and Kumar, S., Chem. Lett. 8, 711 (1996).CrossRefGoogle Scholar
Han, M.Y., Huang, W., Chew, C.H., Gan, L.M., Zhang, X.J., and Ji, W., J. Phys. Chem. B 102, 1884 (1998).CrossRefGoogle Scholar
Yu, S.H., Yang, J., Han, Z.H., Zhou, Y., Yang, R.Y., Xie, Y., Qian, Y.T., and Zhang, Y.H., J. Mater. Chem. 9, 1283 (1999).CrossRefGoogle Scholar
Yang, J., Zeng, J.H., Yu, S.H., Yang, L., Zhou, G.E., Qian, Y.T., Chem. Mater. 12, 3259 (2000).CrossRefGoogle Scholar
Dean, J.A., Lange’s Handbook, 12th ed. (McGraw Book Company, 1987).Google Scholar
Wagner, C.D., Handbook of X-Ray Photoelectron Spectroscopy (Perkin-Elmer Corporation, Minnesota, 1979).Google Scholar
Kaushik, V.K., J. Electron Spectrosc. Relat. Phenom. 56, 273 (1991).Google Scholar
Kuhn, M. and Rodriguez, J.A., J. Phys. Chem. 98, 12059 (1994).CrossRefGoogle Scholar
JCPDS Card File No. 41–1049 (Joint Committee for Powder Diffraction Standards, Swarthmore, PA).Google Scholar
Hull, D. and Bacon, D. J., in Introduction to Dislocation, 3rd ed. (Pergamon Press, 1984), Chap. 2.Google Scholar
Sheldrick, W.S. and Wachhold, M., Angew. Chem. Int. Ed. Engl. 36, 206 (1997).Google Scholar
Ristova, M., Ristov, M., Tosev, P., and Mitreski, M., Thin Solid Films. 315(1–2), 301 (1998).CrossRefGoogle Scholar
Leite, R.C.C., Scott, J.F., and Damen, T.C., Phys. Rev. Lett. 22, 780 (1969); M.L. Curri, A. Agostiano, L. Manna, M. Della Monica, M. Catalano, L. Chiavarone, V. Spagnolo, and M. Lugara, J. Phys. Chem. B 104, 8391 (2000).CrossRefGoogle Scholar
Motte, L., Billoudet, F., and Pileni, M.P., J. Phys. Chem. 99, 16425 (1995).Google Scholar