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Growth of highly oriented La0.84Sr0.16MnO3 perovskite films

Published online by Cambridge University Press:  03 March 2011

Brandon W. Chung ,
Eric L. Brosha ,
Fernando H. Garzon ,
Ian D. Raistrick ,
Robert J. Houlton  and
Marilyn E. Hawley
Brandon W. Chung
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
Eric L. Brosha
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
Fernando H. Garzon
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
Ian D. Raistrick
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
Robert J. Houlton
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
Marilyn E. Hawley
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
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Abstract

We have grown thin films of La0.84Sr0.16MnO3 on SrTiO3 (100), MgO (100), CeO2 (100)/Al2O3, and (100) oriented yttria-stabilized zirconia (YSZ) substrates by using a 90°off-axis RF magnetron sputtering deposition. X-ray diffraction analysis and ion beam channeling experiments reveal that the deposited films grow epitaxially on SrTiO3, biaxially textured on MgO, and highly textured on YSZ. Scanning tunneling microscopy reveals that the thin films possess extremely smooth surfaces.

Type
Articles
Information
Journal of Materials Research , Volume 10 , Issue 10 , October 1995 , pp. 2518 - 2522
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1Cheung, J. T., Morgan, P. E. D., Lowndes, D. H., Zheng, X. Y., and Breen, J., Appl. Phys. Lett. 62, 2045 (1993).CrossRefGoogle Scholar
2Kertesz, M., Riess, I., Tannhauser, D. S., Langpape, R., and Rohr, F. J., J. Solid State Chem. 42, 125 (1982).Google Scholar
3Asamitsu, A., Moritomo, Y., Tomioka, Y., Arima, T., and Tokura, Y., Nature 373, 407 (1995).CrossRefGoogle Scholar
4Eom, C. B., Sun, J. Z., Yamamoto, K., Marshall, A. F., Luther, K. E., Laderman, S. S., and Geballe, T. H., Appl. Phys. Lett. 55, 595 (1989).CrossRefGoogle Scholar
5Eom, C. B., Sun, J. Z., Lairson, B. M., Streiffer, S. K., Marshall, A. F., Yamamoto, K., Anlage, S. M., Bravman, J. C., Geballe, T. H., Laderman, S. S., Tdber, R. C., and Jacowitz, R. D., Physica C 171, 354 (1990).CrossRefGoogle Scholar
6Cole, B. F., Liang, G. C., Newman, N., Char, K., and Zaharchuk, G., Appl. Phys. Lett. 61, 1727 (1992).Google Scholar
7Ohring, M., The Materials Science of Thin Films (Academic Press, Inc., San Diego, CA, 1992), p. 195.CrossRefGoogle Scholar
8Doolittle, L. R., Nucl. Instrum. Methods B 9, 344 (1985).CrossRefGoogle Scholar
9Brosha, E. L., Chung, B. W., and Garzon, F.H.; Figures 1b, 2a, and 2b in Electrochemical Studies of Perovskite Mixed Conductors, edited by Nazri, G-A., Tarascon, J-M., and Schreiber, M. (Mater. Res. Soc. Symp. Proc. 369, Pittsburgh, PA, 1995), p. 349.Google Scholar