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In situ and tomographic characterization of damage and dislocation processes in irradiated metallic alloys by transmission electron microscopy

Published online by Cambridge University Press:  20 February 2015

Josh Kacher ,
Bai Cui  and
Ian M. Robertson
Josh Kacher*
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, California 94720, USA
Bai Cui
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA; and Department of Mechanical and Materials Engineering, University of Nebraska, Lincoln, Nebraska 68588, USA
Ian M. Robertson
Affiliation:
College of Engineering, University of Wisconsin, Madison, Wisconson 53706, USA
*
a)Address all correspondence to this author. e-mail: jkacher@berkeley.edu
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Abstract

Progress toward combining time-resolved experiments with periodic three-dimensional analysis of the evolved microstructural state has been made recently. In situ electron microscopy is used to observe in real time the development of irradiation defects and the influence of these defects on dislocation behavior. Three-dimensional characterization provides information on the true spatial distribution of defects and clarifies effects of the free surfaces in thin films. This quasi-four dimensional analysis approach has been applied to understand the formation of channels in irradiated alloys, the depth distribution of ion damage in an electron transparent foil, and the dislocation channel interactions with grain boundaries. The new insight obtained from these experiments is highlighted and contrasted with findings from simulations.

Type
Invited Reviews
Information
Journal of Materials Research , Volume 30 , Issue 9: Focus Issue: Characterization and Modeling of Radiation Damage on Materials: State of the Art, Challenges, and Protocols , 14 May 2015 , pp. 1202 - 1213
Copyright
Copyright © Materials Research Society 2015 

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Footnotes

Contributing Editor: Khalid Hattar

References

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