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Morphology of α-hexathienyl thin-film-transistor films

Published online by Cambridge University Press:  03 March 2011

A.J. Lovinger ,
D.D. Davis ,
R. Ruel ,
L. Torsi ,
A. Dodabalapur  and
H.E. Katz
A.J. Lovinger
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
D.D. Davis
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
R. Ruel
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
L. Torsi
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
A. Dodabalapur
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
H.E. Katz
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
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Abstract

We have studied the morphology of thin films of α-hexathienyl (α-6T), a hexamer of thiophene that is a very promising material for thin-film-transistor applications. Using electron- and atomic-force microscopies, we found that on both rigid (Si/SiO2 and glass) and flexible (polyimide) substrates, evaporated films show an apparently random, polycrystalline morphology. The crystals are lamellar, ca. 100-200 nm in lateral dimensions and 15-30 nm in thickness, and exhibit irregular boundaries. Nevertheless, electron-diffraction evidence from such films indicates that the constituent molecules are deposited preferentially end-on and assume a normal or nearly normal orientation with respect to their substrates. Rapid high-temperature annealing causes growth of much larger (μm-sized) crystalline grains and a partial transformation to a high-temperature polymorph; however, this process leads to formation of gaps in the film, which may cause deterioration of electronic performance.

Type
Articles
Information
Journal of Materials Research , Volume 10 , Issue 11 , November 1995 , pp. 2958 - 2962
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1Horowitz, G., Fichou, D., Peng, X., and Gamier, F., Synthetic Metals 41–43, 1127 (1991).CrossRefGoogle Scholar
2Gamier, F., Horowitz, G., Peng, X., and Fichou, D., Synthetic Metals 45, 163 (1991).Google Scholar
3Gamier, F., Hajlaoui, R., Yassar, A., and Srivastava, P., Science 265, 1684 (1994).Google Scholar
4Katz, H. E., Torsi, L., Dodabalapur, A., Lovinger, A. J., and Ruel, R., unpublished.Google Scholar
5Servet, B., Ries, S., Trotel, M., Alnot, P., Horowitz, G., and Gamier, F., Adv. Mater. 5, 461 (1993).CrossRefGoogle Scholar
6Gamier, F., Yassar, A., Hajlaoui, R., Horowitz, G., Delofre, F., Servet, B., Ries, S., and Alnot, P., J. Am. Chem. Soc. 115, 8716 (1993).Google Scholar
7Porzio, W., Destri, S., Mascherpa, M., Rossini, S., and Brückner, S., Synthetic Metals 55, 408 (1993).CrossRefGoogle Scholar
8Porzio, W., Destri, S., Mascherpa, M., and Brückner, S., Acta Polym. 44, 266 (1993).CrossRefGoogle Scholar
9Laudise, R.A., Bridenbaugh, P.M., Siegrist, T., Fleming, R.M., Katz, H.E., and Lovinger, A.J., J. Cryst. Growth 152, 241 (1995).CrossRefGoogle Scholar
10Siegrist, T., Fleming, R. M., Haddon, R., Laudise, R. A., Lovinger, A. J., Katz, H. E., Bridenbaugh, P., and Davis, D. D., J. Mater. Res. 10, 2170 (1995).CrossRefGoogle Scholar
11Siegrist, T.et al., unpublished results.Google Scholar
12Servet, B., Horowitz, G., Ries, S., Lagorsse, O., Alnot, P., Yassar, A., Deloffre, F., Srivastava, P., Hajlaoui, R., Lang, P., and Gamier, F., Chem. Mater. 6, 1809 (1994).CrossRefGoogle Scholar
13Lovinger, A.J., unpublished results.Google Scholar
14Torsi, L., Dodabalapur, A., and Katz, H. E., J. Appl. Phys. 78, 1088 (1995).CrossRefGoogle Scholar
15Bassett, D.C., Principles of Polymer Morphology (Cambridge University Press, Cambridge, 1981).Google Scholar
16Frank, F.C. and Tosi, M. P., Proc. R. Soc. London A 263, 323 (1961).Google Scholar
17Hoffman, J. D. and Miller, R. L., Macromolecules 21, 3038 (1988); 22, 3054 (1989).CrossRefGoogle Scholar
18Dodabalapur, A., Torsi, L., and Katz, H. E., Science 268, 270 (1995).CrossRefGoogle Scholar
19Torsi, L., Dodabalapur, A., Lovinger, A. J., Katz, H. E., Ruel, R., Davis, D. D., and Baldwin, K. W., Chem. Mater. (in press).Google Scholar