Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-20T09:37:05.197Z Has data issue: false hasContentIssue false

Preparation of LaFeO3 particles by sol-gel technology

Published online by Cambridge University Press:  31 January 2011

C. Vázquez-Vázquez
Affiliation:
Department of Physical Chemistry, University of Santiago de Compostela, E-15706 Santiago de Compostela, Spain
P. Kögerler
Affiliation:
Department of Physical Chemistry, University of Santiago de Compostela, E-15706 Santiago de Compostela, Spain
M. A. López-Quintela
Affiliation:
Department of Physical Chemistry, University of Santiago de Compostela, E-15706 Santiago de Compostela, Spain
R. D. Sánchez
Affiliation:
Department of Applied Physics, University of Santiago de Compostela, E-15706 Santiago de Compostela, Spain
J. Rivas
Affiliation:
Department of Applied Physics, University of Santiago de Compostela, E-15706 Santiago de Compostela, Spain
Get access

Extract

The study of submicroscopic particles in already known systems has resulted in a renewed interest due to the large differences found in their properties when the particle size is reduced, and because of possible new technological applications. In this work we report the preparation of LaFeO3 particles by the sol-gel route, starting from a solution of the corresponding metallic nitrates and using urea as gelificant agent. Gels were decomposed at 200 °C and calcined 3 h at several temperatures, T, in the range 250–1000 °C. The samples were structurally characterized by x-ray diffraction (XRD) showing that the orthoferrite crystallizes at T as low as 315 °C. From the x-ray diffraction peak broadening, the particle size was determined. The size increases from 60 to 300 nm as the calcination T increases. Infrared spectroscopy was used to characterize gels and calcined samples. From these studies a mechanism for the gel formation is proposed. Study of the magnetic properties of LaFeO3 particles shows the presence of a ferromagnetic component which diminishes as the calcination temperature increases, vanishing at T = 1000 °C.

Type
Articles
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Karlsson, G., Electrochim. Acta 30 (11), 15551561 (1985).Google Scholar
2.Hammouche, A., Siebert, E., and Hammou, A., Mater. Res. Bull. 24, 267280 (1989).CrossRefGoogle Scholar
3.McMurdie, H., Morris, M., Evans, E., Paretzkin, B., Wong-Ng, W., and Hubbard, C., Powd. Diff. 1, 269 (1986).Google Scholar
4.Marezio, M. and Dernier, P.D., Mater. Res. Bull. 6, 2330 (1971).CrossRefGoogle Scholar
5.Sánchez, R.D., Carbonio, R. E., and Causa, M. T., J. Magn. Magn. Mater. 140144, 2147–2148 (1995).Google Scholar
6.Eibschutz, M., Shtrikman, S., and Treves, D., Phys. Rev. 156, 562 (1967).Google Scholar
7.Yan, M. F., Ling, H.C., O'Bryan, H.M., Gallagher, P.K., and Rhodes, W.W., IEEE Trans. Components, Hybrids, Manuf. Technol. 11 (4), 401 (1988).Google Scholar
8.Kordas, G., J. Non-Cryst. Solids 121, 436442 (1990).CrossRefGoogle Scholar
9.James, P. F., in The 2nd European Conference on Advanced Materials and Processes, EUROMAT'91, 350351, University of Cambridge, U.K. (1991).Google Scholar
10.Sakka, S., Mater. Res. Soc. 221232 (1989).Google Scholar
11.Mahía, J., Vázquez-Vázquez, C., Basadre-Pampín, M. I., Mira, J., Rivas, J., López-Quintela, M.A., and Oseroff, S.B., J. Am. Ceram. Soc. 79 (2), 407411 (1996).CrossRefGoogle Scholar
12.Penland, R.B., Mizushima, S., Curran, C., and Quagliano, J.V., J. Am. Chem. Soc. 79, 1575 (1957).Google Scholar
13.Rao, G.V. Subba, Rao, C.N. R., and Ferraro, J. R., Appl. Spectrosc. 24 (4), 436445 (1970).CrossRefGoogle Scholar
14.Conley, R. T., in Infrared Spectroscopy, 2nd ed. (Allyn and Bacon, Inc., Boston, MA, 1972), pp. 167168.Google Scholar
15.Matijević, E. and Hsu, W. P., J. Colloid Interface Sci. 118, 506523 (1987).Google Scholar
16.Shaw, W.H.R. and Bordeaux, J. J., J. Am. Chem. Soc. 77, 47294733 (1955).Google Scholar
17.Yamaguchi, A., Miyazawa, T., Shimanouchi, T., and Mizushima, S., Spectrochim. Acta 10, 170 (1957).CrossRefGoogle Scholar
18.Giesbrecht, E. and Kawashita, M., J. Inorg. Nucl. Chem. 32, 2461 (1970).CrossRefGoogle Scholar
19.Cornell, R.M., Giovanoli, R., and Schneider, W., J. Chem. Technol. Biotechnol. 46, 115134 (1989).CrossRefGoogle Scholar
20.Miller, F.W. Jr. and Dittmar, H. R., J. Am. Chem. Soc. 56, 848849 (1934).Google Scholar
21.Livage, J., Henry, M., and Sánchez, C., Progr. Solid State Chem. 18, 259341 (1988).CrossRefGoogle Scholar
22. International Union of Crystallography, International Tables for X-ray Crystallography, part III, 318323, Dordrecht, The Nether-lands (1985).Google Scholar
23.Sánchez, R.D., Rivas, J., Vázquez-Vázquez, C., López-Quintela, M.A., and Greneche, J.M., unpublished.Google Scholar