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Room-temperature oxidation of ultrathin TiB2 films

Published online by Cambridge University Press:  31 January 2011

Feng Huang
Affiliation:
Department of Metallurgical and Materials Engineering, The University of Alabama, Tuscaloosa, Alabama, 35487–0202, and Center for Materials for Information Technology, The University of Alabama, Tuscaloosa, Alabama 35487–0209
W. J. Liu
Affiliation:
Department of Metallurgical and Materials Engineering, The University of Alabama, Tuscaloosa, Alabama, 35487–0202, and Center for Materials for Information Technology, The University of Alabama, Tuscaloosa, Alabama 35487–0209
J. F. Sullivan
Affiliation:
Department of Chemical Engineering, The University of Alabama, Tuscaloosa, Alabama 35487–0203
J. A. Barnard
Affiliation:
Department of Metallurgical and Materials Engineering, The University of Alabama, Tuscaloosa, Alabama, 35487–0202, and Center for Materials for Information Technology, The University of Alabama, Tuscaloosa, Alabama 35487–0209
M. L. Weaver*
Affiliation:
Department of Metallurgical and Materials Engineering, The University of Alabama, Tuscaloosa, Alabama, 35487–0202, and Center for Materials for Information Technology, The University of Alabama, Tuscaloosa, Alabama 35487–0209
*
a)Author to whom all correspondence should be addressed.mweaver@coe.eng.ua.edu
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Abstract

Titanium diboride has been claimed as a very promising candidate material for protective applications in the magnetic recording. Its oxidation resistance at room temperature is a critical criterion in assessing this application potential. In this paper, the oxidation characteristics of ultrathin TiB2 thin films, such as overcoat erosion and oxide thickness, are investigated via a combination of x-ray reflectivity, x-ray photoelectron spectroscopy (XPS), and atomic force microscopy. It was found that a <2-h exposure to air at room temperature led to the formation of approximately 15-Å-thick, well-defined oxides at the expense of an approximately 9-Å erosion of the TiB2 overcoats, coupled with the existence of a sharp oxide/TiB2 interface. XPS studies confirmed the existence of the oxides. Considering the decreasing allowable thickness for such protective overcoats, oxidation and the resultant thickness gain negate such a potential of ultrathin TiB2 films. The results in our current report provide a new perspective on its potential as protective overcoats in magnetic recording.

Type
Articles
Copyright
Copyright © Materials Research Society 2002

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