Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-21T23:31:23.256Z Has data issue: false hasContentIssue false

Synthesis, crystal structure, and anisotropic thermal expansion of Dy4.67(SiO4)3O

Published online by Cambridge University Press:  03 March 2011

S.T. Misture
Affiliation:
NYS College of Ceramics at Alfred University, Alfred, New York 14802
S.P. Harvey
Affiliation:
NYS College of Ceramics at Alfred University, Alfred, New York 14802
R.T. Francy
Affiliation:
NYS College of Ceramics at Alfred University, Alfred, New York 14802
Y. Gao S. DeCarr
Affiliation:
GE Global Research, Niskayuna, New York 12309
S.C. Bancheri
Affiliation:
GE Global Research, Niskayuna, New York 12309
Get access

Abstract

A new phase in the Dy–Si–O system, Dy4.67(SiO4)3O, was prepared in powderform using the mixed oxide method. Dy4.67(SiO4)3O was first observed at 1300 °C, and phase purity was achieved after 96 h at 1600 °C. The crystal structure was determined using single crystal diffraction using synchrotron radiation, and powder x-ray diffraction data was refined using the Rietveld method. The structure was found to be apatite-type, hexagonal, with space group P63/m and a = b = 0.93883(2) nm,c = 0.67820(1) nm, Z = 2. High-temperature x-ray powder diffraction was used to characterize the anisotropic thermal expansion over the temperature range of 24–1450 °C, providing the axial and cell volume expansion.

Type
Articles
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Chambers, J.J. and Parsons, G.N.: J. Appl. Phys. 90, 918 (2001).CrossRefGoogle Scholar
2.Wilk, G.D., Wallace, R.M. and Anthony, J.M.: J. Appl. Phys. 87, 484 (2000).CrossRefGoogle Scholar
3.Zhang, Q.Y., Pita, K., Buddhudu, S. and Kam, C.H.: J. Phys. D: Appl. Phys. 35, 3085 (2002).CrossRefGoogle Scholar
4.Marsh, P.J., Silver, J., Vecht, A. and Newport, A.: J. Lumin. 97, 229 (2002).CrossRefGoogle Scholar
5.Nowok, J.W., Kay, J.P. and Kulas, R.J.: J. Mater. Res. 16, 2251 (2001).CrossRefGoogle Scholar
6.Kamal, S., Saodekar, P.V. and Bhoga, S.S.: Bull. Mater. Sci. 21, 469 (1998).Google Scholar
7.Masayiki, K., Yuzura, O. and Tatsuo, M.: J. Jpn. Inst. Metals 63, 661 (1999).Google Scholar
8.Kato, M., Fukasawa, T. and Goto, Y.: J. Ceram. Soc. Jpn. 108, 861 (2000).CrossRefGoogle Scholar
9.Wills, R., Cunningham, J.A., Wimmer, J.M. and Stewart, R.W.: J. Am. Ceram. Soc. 59, 269 (1976).CrossRefGoogle Scholar
10.Belokoneva, E.L., Petrova, T.L., Simonov, M.A. and Belov, N.V.: Kristallografiya 17, 490 (1972).Google Scholar
11.Smolin, Yu.I. and Shepelev, Yu.F.: Izvestiya Adademii Nauk SSSR Neogranicheskie Materialy. 5, 1823 (1969).Google Scholar
12.Kuz’min, E.A. and Belov, A.N.V.: Doklady Adademii Nauk SSSR. 165, 88 (1965).Google Scholar
13. Inorganic Crystal Structure Database, Version 1.20 (Fachinformationszentrum Karlsruhe, Germany, and the U.S. Department of Commerce, February 2003).Google Scholar
14. Diffrac Plus, Topas, Bruker AXS GmbH, Karlsruhe, Germany.Google Scholar
15.SAINT, Program to Integrate and Reduce Raw Crystallographic Area Detector Data (Siemens Analytical X-ray Instruments Inc., Madison, WI, 1996).Google Scholar
16.Blessing, R.H.J.: J. Appl. Crystallogr. 30, 421 (1997).CrossRefGoogle Scholar
17.Sheldrick, G.M. SHELXL97. Program for Crystal Structure Refinement (University of Göttingen, Göttingen, Germany, 1997).Google Scholar
18.Misture, S.T.: Meas. Sci. Technol. 14, 1091 (2003).CrossRefGoogle Scholar
19.Thermal Expansion, Thermophysical Properties of Matter, Vol. 12, edited by Touloukian, Y.S., Kirby, R.K., Taylor, R.E., and Desai, P.D. (IFI/Plenum, New York, 1977), pp. 176193.CrossRefGoogle Scholar
20.Pawley, G.S.: J. Appl. Crystallogr. 14, 357 (1981).CrossRefGoogle Scholar
21.Kolitsch, U., Seifert, H.J. and Aldinger, F.: J. Phase Equil. 19(5), 426 (1998).Google Scholar
22.Aparicio, M. and Duran, A.: J. Am. Ceram. Soc. 80, 1351 (2000).CrossRefGoogle Scholar
23.Felsche, J.: J. Solid State Chem. 5, 266 (1972).CrossRefGoogle Scholar
24. International Centre for Diffraction Data PDF-2 (Newtown Square, PA, 2003).Google Scholar
25.Fukuda, K. and Matsubara, H.: J. Mater. Res. 18, 1715 (2003).CrossRefGoogle Scholar
26.Nakayama, S., Sakamoto, M., Higuchi, M., Kodaira, K., Sato, M., Kakita, S., Suzuki, T. and Itoh, K.: J. Eur. Ceram. Soc. 19(4), 507 (1999).Google Scholar
27.Sansom, J.E.H., Richings, D. and Slater, P.R.: Solid State Ionics 139, 205 (2001).CrossRefGoogle Scholar