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TEM studies on twin boundary in YBa2Cu3O7 and YBa2(Cu0.98M0.02)3O7 (M = Zn, Al)

Published online by Cambridge University Press:  31 January 2011

Yimei Zhu ,
Masaki Suenaga  and
Youwen Xu
Yimei Zhu
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, New York 11973
Masaki Suenaga
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, New York 11973
Youwen Xu
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, New York 11973
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Abstract

High resolution electron microscopy of the twin boundary layers in YBa2(Cu1−xMx)3O7+δ for x = 0 and 0.02 and M = Zn and Al showed that the boundary widths are ∼1 nm for the pure and the Zn substituted YBa2Cu3O7 and ∼3 nm for the Al substituted oxide. From two beam contract studies and the high resolution images, it was concluded that the respective lattice plane across the boundary is shifted by (⅓–½)·2d(110) along the boundary. The broadening of the layer by the Al substitution is also thought to be a cause for the reduction of the twin boundary energy, leading to an increased twin density.

Type
Articles
Information
Journal of Materials Research , Volume 5 , Issue 7 , July 1990 , pp. 1380 - 1387
Copyright
Copyright © Materials Research Society 1990

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References

1Deutscher, G. and Muller, A. K., Phys. Rev. Lett. 59, 1745 (1987).CrossRefGoogle Scholar
2Daeumling, M., Seuntjens, J., and Larbalestier, D. C., Appl. Phys. Lett. 52, 590 (1988).CrossRefGoogle Scholar
3Kes, P. H., Physica C 153–155, 1121 (1988).CrossRefGoogle Scholar
4Matsushita, T., Funaki, K., Takeo, M., and Yamafuji, K., Jpn. J. Appl. Phys. 26, L1524 (1987).CrossRefGoogle Scholar
5Ya, L.. Vinnikov, Gurevich, L. A., Emil'chenko, G. A., and Osip'yan, Yu. A., Pis'ma Zh. eksp. teor. Fiz. 47, 109 (1988); JETP Lett. 47 131 (1988).Google Scholar
6Dolan, G. J., Chandrashekhar, G. V., Dinger, T. R., Field, C., and Holtzberg, F., Phys. Rev. Lett. 62, 827 (1989).CrossRefGoogle Scholar
7Tu, K. N., Yeh, N. C., Park, S. I., and Tsuei, C. C., Phys. Rev. B 39, 304 (1989).CrossRefGoogle Scholar
8Jou, C. J. and Washburn, J., J. Mater. Res. 4 (4), 795 (1989).CrossRefGoogle Scholar
9Zhu, Y., Suenaga, M., Xu, Y., Sabatini, R. L., and Mooden-baugh, A. R., Appl. Phys. Lett. 54, 374 (1989).CrossRefGoogle Scholar
10Zhu, Y., Suenaga, M., Sabatini, R. L., and Xu, Y., Proc. 47th Annual Meeting of Electron Microscopy Society of America, San Antonio, Aug. 1989, edited by G. W. Bailey, 168 (1989).CrossRefGoogle Scholar
11Zhu, Y., Suenaga, M., and Xu, Y., Philos. Mag. Lett. 60, 51 (1989).CrossRefGoogle Scholar
12Xu, Y., Suenaga, M., Tafto, J., Sabatini, R. L., Moodenbaugh, A. R., and Zolliker, P., Phys. Rev. B 39, 6667 (1989).CrossRefGoogle Scholar
13 The Division of Materials and Chemical Sciences, Lawrence Berkeley Laboratory, University of California, Berkeley, CA.Google Scholar
14Roy, T., Sickafus, K., Clinard, F. W., and Mitchell, T. E., Proc. 47th Annual Meeting of Electron Microscopy Society of America, San Antonio, Aug. 1989, edited by G. W. Bailey, 184 (1989).CrossRefGoogle Scholar
15Camps, R. A., Evetts, J. E., Clowacki, B. A., Newcomb, S. B., and Stubbs, W. M., J. Mater. Res. 2, 750 (1987).Google Scholar
16Landuyt, J. van, Gevers, R., and Amelinckx, S., Phys. Status Solidi 13, 467 (1966).CrossRefGoogle Scholar
17Gevers, R., Landuyt, J. van, and Amelinckx, S., Phys. Status Solidi 11, 689 (1965).CrossRefGoogle Scholar
18Amelinckx, S. and Landuyt, J. van, in Electron Microscopy in Min-eralogy, edited by J. M. Christie, J. M. Colley, A. H. Hener, G. Thomas, and N. J. Tighe, 68 (1976).Google Scholar
19Wordenweber, R., Sastry, G. V. S., Heinenmen, K., and Hrey-hardt, H. C., J. Appl. Phys. 65, 1649 (1989).Google Scholar
20Schmahl, W. W., Putnis, A., Salje, E., Freeman, P., Graeme-Barber, A., Jones, R., Singh, K. K., Blunt, J., Edwards, P. P., Loram, J., and Mirza, K., Philos. Mag. Lett, (to be published).Google Scholar
21Chandrasekar, N., Welch, D. O., and Suenaga, M., presented at 1988 Fall Meeting of the Materials Research Society, Boston, MA, 1988.Google Scholar
22Welch, D. O., unpublished and see Ref. 12.Google Scholar
23Bordet, P., Hodeau, J. L., Strobel, P., Marezio, M., and Santoro, A., Solid State Commun. 66, 435 (1988).CrossRefGoogle Scholar
24Hodeau, J. L., Bordet, P., Capponi, J. J., Chaillout, C., and Marezio, M., Physica C 153–155, 582 (1988).CrossRefGoogle Scholar