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Probability of detection of internal voids in structural ceramics using microfocus radiographya)

Published online by Cambridge University Press:  31 January 2011

George Y. Baaklini  and
Don J. Roth
George Y. Baaklini
Affiliation:
Cleveland State University, Cleveland, Ohio 44115
Don J. Roth
Affiliation:
National Aeronautics and Space Administration, Lewis Research Center, Cleveland, Ohio 44135
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Abstract

The reliability of microfocus x radiography for detecting internal voids in structural ceramic test specimens was statistically evaluated. The microfocus system was operated in the projection mode using low x-ray photon energies (<20 keV) and a 10 μm focal spot. The statistics were developed for implanted internal voids in green and sintered silicon carbide and silicon nitride test specimens. These statistics were compared with previously obtained statistics for implanted surface voids in similar specimens. Problems associated with void implantation and characterization are discussed. Statistical results are given as probability-of-detection curves at a 95% confidence level for voids ranging in size from 20–528 μm in diameter.

Type
Articles
Information
Journal of Materials Research , Volume 1 , Issue 3 , June 1986 , pp. 457 - 467
Copyright
Copyright © Materials Research Society 1986

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