Hostname: page-component-cd9895bd7-fscjk Total loading time: 0 Render date: 2024-12-26T15:38:14.683Z Has data issue: false hasContentIssue false
  • English
  • Français

High-current laser ion source based on a low-power laser

Published online by Cambridge University Press:  25 March 2004

M. OGAWA ,
M. YOSHIDA ,
M. NAKAJIMA ,
J. HASEGAWA ,
S. FUKATA ,
K. HORIOKA  and
Y. OGURI
M. OGAWA
Affiliation:
Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, Meguro, Tokyo 152-8550 Japan
M. YOSHIDA
Affiliation:
Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, Meguro, Tokyo 152-8550 Japan
M. NAKAJIMA
Affiliation:
Department of Energy Sciences, Tokyo Institute of Technology, Nagatsuta, Yokohama, 226-8501 Japan
J. HASEGAWA
Affiliation:
Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, Meguro, Tokyo 152-8550 Japan
S. FUKATA
Affiliation:
Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, Meguro, Tokyo 152-8550 Japan
K. HORIOKA
Affiliation:
Department of Energy Sciences, Tokyo Institute of Technology, Nagatsuta, Yokohama, 226-8501 Japan
Y. OGURI
Affiliation:
Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, Meguro, Tokyo 152-8550 Japan
Get access Rights & Permissions [Opens in a new window]

Abstract

An ion source for generation of low-charged heavy ions has been developed using low-power KrF excimer and frequency-doubled Nd:YAG lasers. The ion source was examined with two experimental modes of low-voltage DC extraction at ∼20 kV and high-voltage pulse extraction at 150 kV. Normalized emittance of extracted beams composed of Cu+ and Cu2+ ions was measured to be about 0.05 and 0.8 πmm-mrad for the DC extraction and the pulse extraction, respectively. Electron temperature was observed by means of a single probe method to be 0.8 to 2.5 eV, depending on the intensity of the KrF laser.

Keywords

emittanceheavy ionKrFlaserNd:YAGplasmasourcetemperature
Type
Research Article
Information
Laser and Particle Beams , Volume 21 , Issue 4 , October 2003 , pp. 633 - 638
Copyright
© 2003 Cambridge University Press

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Amoruso, S., Armenate, M., Berardi, V., Bruzzese, R., Pica, G. & Velotta, R. (1996). Charged species analysis as a diagnostic tool for laser produced plasma characterization. Appl. Surf. Sci. 106, 507–512.Google Scholar
Bangerter, R.O. (1999). Status of the US heavy ion fusion program. Fusion Eng. Des. 44, 71–79.Google Scholar
Brown, I.G. (1989). The Physics and Technology of Ion Sources. New York: John Wiley & Sons.
Hasegawa, J., Yoshida, M., Oguri, Y., Ogawa, M., Nakajima, M. & Horioka, K. (2000). High-current laser ion source for induction accelerators. Nucl. Instrum. Methods B 161–163, 1104–1107.Google Scholar
Henkelmann, T., Korschinek, G., Belayev, G., Dubenkov, V., Golubev, A., Latyshev, S., Sharkov, B., Shmshurov, A. & Wolf, B. (1992). Charge state distribution of tantalum ions produced simultaneously by CO2 and Nd:YAG laser from a laser ion source. Rev. Sci. Instrum. 63, 2828–2830.Google Scholar
Mora, P. (1982). Theoretical model of absorption of laser light by a plasma. Phys. Fluids 25, 1051–1056.Google Scholar
Roudskoy, I. et al. (1996). General feature of highly charged ion generation in laser produced plasmas. Laser Part. Beams 14, 369–384.Google Scholar
Sharkov, B.Y., Kondrashev, S., Roudskoy, I., Savin, S., Shumshurov, A., Haseroth, H., Kugler, H., Langbein, K., Lisi, N., Magnusson, H., Scrivens, R., Schnuringer, J.C., Tambini, J., Homenko, S., Makarov, K., Roerich, V., Stepanov, A. & Satov, Y. (1998). Laser ion source for heavy ion synchrotrons. Rev. Sci. Instrum. 69, 1035–1039.Google Scholar
Tyrrell, G.C., Coccia, L.G., York, T.H. & Boyd, I.W. (1996). Energy-dispersive mass spectrometry of high energy ions generated during KrF excimer and frequency-doubled Nd:YAG laser ablation of metals. Appl. Surf. Sci. 96–98, 227–232.Google Scholar
Von Gutfeld, R.J. & Drefus, R.W. (1989). Electric probe measurements of pulsed ablation at 248 nm. Appl. Phys. Lett. 54, 1212–1214.Google Scholar
Wang, J.G., Wang, D.X. & Reser, M. (1991). Beam emittance measured by the pepper-pot method. Nucl. Instrum. Methods A 307, 190–194.Google Scholar
Weaver, I., Martin, G.W., Graham, W.G., Morrow, T. & Lewis, C.L.S. (1999). The Langmuir probe as a diagnostic of the electron component within low temperature laser ablated plasma plumes. Rev. Sci. Instrum. 70, 1801–1805.Google Scholar
Yoshida, M., Hasegawa, J., Fukata, S., Oguri, Y., Ogawa, M., Nakajima, M., Horioka, K. & Shiho, M. (2000). Development of a high-current laser ion source for induction accelerators. Rev. Sci. Instrum. 71, 1216–1218.Google Scholar
Yoshida, M., Hasegawa, J., Fukata, S., Oguri, Y., Ogawa, M., Nakajima, M., Horioka, K., Maebara, S. & Shiho, M. (2001). A simple time-resolved emittance measurement of a laser ion source with a digital camera. Nucl. Instrum. Methods A 464, 582–586.Google Scholar