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Evaluation of focusing characteristics of spherical plasma focus diode

Published online by Cambridge University Press:  16 October 2009

Kazuo Imanari ,
Takeru Bingo ,
Kozue Sasaki ,
Weihua Jiang ,
Katsumi Masugata  and
Kiyoshi Yatsui
Kazuo Imanari
Affiliation:
Laboratory of Beam Technology and Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940-21, Japan
Takeru Bingo
Affiliation:
Laboratory of Beam Technology and Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940-21, Japan
Kozue Sasaki
Affiliation:
Laboratory of Beam Technology and Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940-21, Japan
Weihua Jiang
Affiliation:
Laboratory of Beam Technology and Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940-21, Japan
Katsumi Masugata
Affiliation:
Laboratory of Beam Technology and Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940-21, Japan
Kiyoshi Yatsui
Affiliation:
Laboratory of Beam Technology and Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940-21, Japan
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Abstract

Experiments and the associated simulations for the evaluation of the focusibility of spherical Plasma focus diode (SPFD) were carried out. To evaluate the ion beam focusibility, two types of time-integrated Rutherford scattering pinhole camera were used: angle-integrated and angle-resolved type. From the former method, the ion beam has been found to focus in a cylindrical area with 4.5mmφ × 6.0 mm. The ion density profile shows a peak at 2.5 mm downstream from the geometric focusing point. From the latter method, it is found that a large fraction of the ion beam is produced from the downstream region of the diode. In simulations, the influence of an initial ion thermal energy was evaluated on the ion beam focusibility. When the initial energy is 20 eV, the ion beam focused in a cylindrical area of 0.4 mmφ × 2.4 mm. The experimental focusing parameters seem to be much worse than those evaluated numerically presumably due to the aiming error of ion beam.

Type
Regular Papers
Information
Laser and Particle Beams , Volume 16 , Issue 1: Special Issue: 24th ECLIM , March 1998 , pp. 177 - 183
Copyright
Copyright © Cambridge University Press 1998

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References

Jiang, W. et al. 1993 Jpn. J. Appl. Phys. 32, L752.CrossRefGoogle Scholar
Jiang, W. et al. 1995a Phys. Plasmas 2, 325.CrossRefGoogle Scholar
Jiang, W. et al. 1995b Laser Part. Beams 13, 343.CrossRefGoogle Scholar
Tokuchi, A. et al. 1986 In Proc. 2nd Int'l Symp. on Inertial Confinement Fusion Res. by High-Power Particle Beams, Yatsui, K., ed. (Nagaoka Univ. of Technology), 430.Google Scholar
Vandevender, J.P. et al. 1986 Science 232, 831.CrossRefGoogle Scholar
Yatsui, K. et al. 1986 In Proc. 11th Int'l Conf. on Plasma Phys. and Controlled Nucl. Fusion Res. Kyoto, Japan IAEA-CN-47/B-III-9.Google Scholar
Yatsui, K. 1989 Laser Part. Beams 7, 73.CrossRefGoogle Scholar
Yatsui, K. et al. 1994 Phy. Plasmas 1, 1730.CrossRefGoogle Scholar
Yatsui, K. et al. 1995 Appl. Phys. Letters 67, 1214.CrossRefGoogle Scholar