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High Resolution X-Ray CT Reconstruction of Additively Manufactured Metal Parts using Generative Adversarial Network-based Domain Adaptation in AI-CT

Published online by Cambridge University Press:  30 July 2021

Amir Ziabari ,
Abhishek Dubey ,
Singanallur Venkatakrishnan ,
Curtis Frederick ,
Philip Bingham ,
Ryan Dehoff  and
Vincent Paquit
Amir Ziabari
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Abhishek Dubey
Affiliation:
Center of Cancer Research, National Cancer Institute, United States
Singanallur Venkatakrishnan
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Curtis Frederick
Affiliation:
Carl Zeiss Industrial Metrology, United States
Philip Bingham
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Ryan Dehoff
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Vincent Paquit
Affiliation:
Oak Ridge National Laboratory, United States

Abstract

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Type
Advanced Characterization of Components Fabricated by Additive Manufacturing
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2940 - 2942
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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