Hostname: page-component-77c89778f8-5wvtr Total loading time: 0 Render date: 2024-07-22T12:18:23.601Z Has data issue: false hasContentIssue false

New View of Low-Temperature Sintering Phenomenon of Nanometer-Size Particles Based on Molecular Dynamics Study

Published online by Cambridge University Press:  10 May 2016

Norie Matsubara*
Affiliation:
Department of Materials Science and Engineering, Kyushu University, 744 Motooka, Fukuoka, 819-0395, Japan.
Shinji Munetoh
Affiliation:
Department of Materials Science and Engineering, Kyushu University, 744 Motooka, Fukuoka, 819-0395, Japan.
Osamu Furukimi
Affiliation:
Department of Materials Science and Engineering, Kyushu University, 744 Motooka, Fukuoka, 819-0395, Japan.
Get access

Abstract

In this study, we have investigated a behavior of particle with diameter several ten nanometers size at the time of heating on an atomic scale by numerical analysis using the molecular dynamics (MD) simulation. On solving the equation of motion, the Langevin equation was adopted. The Finnis-Sinclair potential, which can well reproduce the mechanical properties of a BCC-metal, was used as the interatomic force. We determined the relationship between the melting point (Tm) of the nano-sized particles and its diameter by MD simulations. We have also investigated the self-diffusion coefficient of each atom-forming at a temperature larger or less than Tm of the submicron-size metal particles . As a result, even in case of heating at a temperature larger than Tm, the mean self-diffusion coefficient at the center of a particle was 10-7–10-6 cm2/sec. On the other hand, at the surface layer of the particle was two to three orders of magnitude larger than that at the center. Those particles were in a quasi-molten state. It is conceivable that the thickness of the surface layer can explain a phenomenon that sintering progresses as the heating temperature increases.

Type
Articles
Copyright
Copyright © Materials Research Society 2016 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Morita, T., Yasuda, Y., Ide, E., Akada, Y. and Hirose, A., Mater. Trans. 49, 28752880 (2008).CrossRefGoogle Scholar
Kato, F., Lang, F., Rejeki, S., Nakagawa, H., Yamaguchi, H. and Sato, H., IMAPs HiTEN. 254 (2013).Google Scholar
Ogura, H., Maruyama, M., Matsubayashi, R., Ogawa, T., Nakamura, S., Komatsu, T., Nakagawa, H., Ichimura, A. and Isoda, S., J. Electronic Mater. 40(6), 1394 (2011).Google Scholar
Finnis, M. W. and Sinclair, J. E., Philos. Mag. A 50, 45 (1984).Google Scholar
van Gunsteren, W. F. and Berendsen, H. J. C., Mol. Phys. 45, 637 (1982).Google Scholar
Shibuta, Y., Takamoto, S. and Suzuki, T., ISIJ Int. 48, 1582 (2008).Google Scholar
Buffat, PH. and Borel, J-P., Phys. Rev. A 13 (6), 22872298 (1976).Google Scholar
Eridberg, J., Torndahk, L. E. and Hillert, M., Jernkont. Ann. 153, 263 (1969).Google Scholar
Yang, L., Simnad, M. T. and Derge, G., Trans. AIME. 206, 1577 (1956).Google Scholar