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Atomic electron tomography in three and four dimensions

Published online by Cambridge University Press:  09 April 2020

Jihan Zhou ,
Yongsoo Yang ,
Peter Ercius  and
Jianwei Miao
Jihan Zhou
Affiliation:
Department of Physics and Astronomy, and California NanoSystems Institute, University of California, Los Angeles, USA; jihan.zhou@physics.ucla.edu
Yongsoo Yang
Affiliation:
Department of Physics, Korea Advanced Institute of Science and Technology, Republic of Korea; yongsoo.yang@kaist.ac.kr
Peter Ercius
Affiliation:
National Center for Electron Microscopy, Molecular Foundry Division, Lawrence Berkeley National Laboratory, USA; percius@lbl.gov
Jianwei Miao
Affiliation:
Department of Physics and Astronomy, and California NanoSystems Institute, University of California, Los Angeles, USA; miao@physics.ucla.edu
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Abstract

Atomic electron tomography (AET) has become a powerful tool for atomic-scale structural characterization in three and four dimensions. It provides the ability to correlate structures and properties of materials at the single-atom level. With recent advances in data acquisition methods, iterative three-dimensional (3D) reconstruction algorithms, and post-processing methods, AET can now determine 3D atomic coordinates and chemical species with sub-Angstrom precision, and reveal their atomic-scale time evolution during dynamical processes. Here, we review the recent experimental and algorithmic developments of AET and highlight several groundbreaking experiments, which include pinpointing the 3D atom positions and chemical order/disorder in technologically relevant materials and capturing how atoms rearrange during early nucleation at four-dimensional atomic resolution.

Type
Nanoscale Tomography Using X-rays and Electrons
Information
MRS Bulletin , Volume 45 , Issue 4: Nanoscale Tomography Using X-rays and Electrons , April 2020 , pp. 290 - 297
Copyright
Copyright © Materials Research Society 2020

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