Hostname: page-component-5c6d5d7d68-xq9c7 Total loading time: 0 Render date: 2024-08-18T07:25:44.045Z Has data issue: false hasContentIssue false

Atomistic Simulations of Friction at Sliding Diamond Interfaces

Published online by Cambridge University Press:  29 November 2013

Get access

Extract

Friction, or the resistance to motion of two bodies in contact, and the related phenomenon of wear are two of the more costly problems facing industry today. Despite their importance, a fundamental understanding of friction and wear, especially at the atomic scale, has remained elusive. This is rapidly changing, however, as new scientific instrumentation has been developed that allows, for the first time, the study of friction at the atomic scale. These pioneering efforts have led to the emergence of a rapidly growing field called nanotribology, the subject of this issue of the MRS Bulletin. Some of the contributing techniques include the surface force apparatus, which has been used to study the rheology of molecularly thin liquid layers, a quartz-crystal microbalance, which has been used to measure the sliding friction of molecularly thin adsorbed films, and the atomic force microscope (AFM), which has been used to measure the frictional force between a sharp tip (possibly a single asperity) and a flat surface during sliding. In addition to providing a vast amount of information related to friction on the atomic scale, these innovative experiments have provided the necessary data to test the validity of older theoretical models and have stimulated new theoretical work. For instance, atomic-scale friction has been investigated theoretically using analytic models, first principles calculations, and molecular dynamics simulations.

Type
Nanotribology
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Granick, S., MRS Bulletin 16 (10) (1991) p. 33.CrossRefGoogle Scholar
2.Chen, Y-L. and Israelachvilli, J.N., J. Phys. Chem. 96 (1992) p. 7752; H. Yoshizawa, Y-L. Chen, and J.N. Israelachvilli, Wear (1993), in press.CrossRefGoogle Scholar
3.Van Alsten, J. and Granick, S., Phys. Rev. Lett. 61 (1991) p. 33.Google Scholar
4.Krim, J., Solina, D.H., and Chiarello, R., Phys. Rev. Lett. 66 (1991) p. 181.CrossRefGoogle Scholar
5.Mate, C.M., McClelland, G.M., Erlandsson, R., and Chiang, S., Phys. Rev. Lett. 59 (1987) p. 1942.CrossRefGoogle Scholar
6.Erlandsson, R., Hadziloannou, G., Mate, C.M., McClelland, G.M., and Chiang, S., J. Chem. Phys. 89 (1988) p. 5190.CrossRefGoogle Scholar
7.German, G.J., Cohen, S.R., Neubauer, G., McClelland, G.M., and Seki, H., J. Appl. Phys. 73 (1993) p. 163.CrossRefGoogle Scholar
8.Mate, C.M., Wear (1993), in press.Google Scholar
9.Meyer, E., Overney, R., Brodbeck, D., Howald, L., Luthi, R., Frommer, J., and Güntherodt, H-J., Phys. Rev. Lett. 69 (1992) p. 1777.CrossRefGoogle Scholar
10.Tomlinson, G.A., Philos. Mag. 7 (1929) p. 905.CrossRefGoogle Scholar
11.Frenkel, F.C. and Kontorova, T., Zh. Eksp. Teor. Viz. [Sov. Phys. JETP] 8 (1938) p. 1340.Google Scholar
12.Hirano, M., Shinjo, K., Kaneko, R., and Murata, Y., Phys. Rev. Let. 67 (1991) p. 2642.CrossRefGoogle Scholar
13.Sokoloff, J.B., Phys. Rev. B 42 (1990) p. 760.CrossRefGoogle Scholar
14.Zhong, W. and Tomanek, D., Phys. Rev. Lett. 64 (1990) p. 3054.CrossRefGoogle Scholar
15.McClelland, G.M. and Glosli, J.N., N.A.T.O. ASI Proceedings on “Fundamentals of Friction: Macroscopic and Microscopic Processes”, edited by Singer, I.L. and Pollock, H.M., (Kluwer Academic Publishers, Dordrecht, 1992) p. 405.Google Scholar
16.Landman, U. and Luedtke, W.D., J. Vac. Sci. Technol. B 9 (1991) p. 414.CrossRefGoogle Scholar
17.Thompson, P.A. and Robbins, M.O., Phys. Rev. Lett. 63 (1989) p. 766.CrossRefGoogle Scholar
18.Thompson, P.A. and Robbins, M.O., Science 250 (1990) p. 792.CrossRefGoogle Scholar
19.Harrison, J.A., White, C.T., Colton, R.J., and Brenner, D.W., Phys. Rev. B 46 (1992) p. 9700.CrossRefGoogle Scholar
20.Harrison, J.A., White, C.T., Colton, R.J., and Brenner, D.W., Wear (1993), in press.Google Scholar
21.Harrison, J.A., White, C.T., Colfon, R.J., and Brenner, D.W, J. Phys. Chem. (1993), submitted.Google Scholar
22.Brenner, D.W., Phys. Rev. B 42 (1990) p. 9458.CrossRefGoogle Scholar
23.Hayward, I.P., Singer, I.L., and Seitzman, L.E., Wear 157 (1992) p. 215.CrossRefGoogle Scholar
24.Miyoshi, K., Wu, R.L.C., and Garscadden, A., Surf. Coat. Technol. 54/55 (1992) p. 428.CrossRefGoogle Scholar
25.Kohzaki, M., Higuchi, K., Noda, S., and Uchida, K., J. Mater. Res. 7 (1992) p. 1769.CrossRefGoogle Scholar
26.Tabor, D., Properties of Diamond, edited by Field, J.E. (Academic Press, London, 1979) p. 325.Google Scholar
27.Enomoto, Y. and Tabor, D., Proc. R. Soc. London, Ser. A 373 (1981) p. 405.Google Scholar
28.Samuels, B. and Wilks, J., J. Mater. Sci. 23 (1988) p. 2846.CrossRefGoogle Scholar
29.Berendsen, H.J.C., Postma, J.P.M., van Gunsteren, W.F., DiNola, A., and Haak, J.R., J. Chem. Phys. 81 (1984) p. 3684.CrossRefGoogle Scholar
30.Harrison, J.A., White, C.T., Colton, R.J., and Brenner, D.W., Surf. Sci. 271 (1992) p. 57.CrossRefGoogle Scholar
31.Harrison, J.A., Brenner, D.W., White, C.T., and Colton, R.J., Thin Solid Films 206 (1991) p. 213.CrossRefGoogle Scholar
32.Singer, I.L., Surf. Coat. Technol. (1990) p. 93.Google Scholar