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Coherent Lorentz Imaging of Soft, Thin-Film Magnetic Materials

Published online by Cambridge University Press:  29 November 2013

Stephen McVitie  and
John N. Chapman
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Extract

A detailed knowledge of the micromagnetic structure of thin films is essential for our understanding of the magnetic processes in modern magnetic materials. Many technological applications in the magnetic-recording industry involve thin-film materials including magnetic and magneto-optic recording media and magneto-resistive sensors. Electron microscopy allows imaging of the magnetic structure of such thin films with very high spatial resolution. It is also possible in certain instruments to study the behavior of the materials in the presence of a magnetic field while the specimen is still in the microscope. This facility offers the prospect of full magnetic characterization of thinned materials using electron microscopy.

Type
Magnetism on a Microscopic Scale
Information
MRS Bulletin , Volume 20 , Issue 10 , October 1995 , pp. 55 - 58
Copyright
Copyright © Materials Research Society 1995

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References

1.Chapman, J.N., J. Phys. D 17 (1984) p. 623.Google Scholar
2.Jakubovics, J.P., in Electron Microscopy in Materials Science, edited by Ruedl, E. and Valdré, U. (Commission of European Communities, 1975) p. 1303.Google Scholar
3.Jiles, D., in Magnetism and Magnetic Materials, 1st ed. (Chapman and Hall Publishers, 1991) p. 127.Google Scholar
4.Chapman, J.N., Ferrier, R.P., Heyderman, L.J., McVitie, S., Nicholson, W.A.P., and Bormans, B.J.M., in Electron Microscopy and Analysis, Institute of Physics Conference Series no. 138 (1993) p. 1.Google Scholar
5.Chapman, J.N., Johnston, A.B., Heyderman, L.J., McVitie, S., and Nicholson, W.A.P., IEEE Trans. Magn. 30 (1994) p. 4479.CrossRefGoogle Scholar
6.Tonomura, A., IEEE Trans. Magn. 29 (1994) p. 2488.CrossRefGoogle Scholar
7.McVitie, S. and Chapman, J.N., IEEE Trans. Magn. 24 (1988) p. 1778.CrossRefGoogle Scholar
8.Chapman, J.N., McVitie, S., and Hefferman, S.J., J. Appl. Phys. 69 (1991) p. 6078.CrossRefGoogle Scholar
9.Hefferman, S.J., Chapman, J.N., and McVitie, S., J. Magn. Mater. 95 (1991) p. 76.CrossRefGoogle Scholar