Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-24T04:50:20.508Z Has data issue: false hasContentIssue false
  • English
  • Français

Probing Diffusion Kinetics with Secondary Ion Mass Spectrometry

Published online by Cambridge University Press:  31 January 2011

Roger A. De Souza  and
Manfred Martin
Get access

Abstract

Secondary ion mass spectrometry (SIMS) is a powerful analytical technique for determining elemental and isotopic distributions in solids. One of its main attractions to researchers in the field of solid-state ionics is its ability to distinguish between isotopes of the same chemical element as a function of position in a solid. With enriched stable isotopes as diffusion sources, this allows self-diffusion kinetics in solids to be studied. In this article, taking oxygen isotope diffusion in oxides as our main example, we present the standard experimental method, and, subsequently, we discuss several promising developments, in particular the opportunities offered by thin-film geometries, and the investigation of inhomogeneous systems, including possible fast diffusion along grain boundaries and making space-charge layers at interfaces “visible.” These examples demonstrate that SIMS is capable of probing mass transport processes over various length scales, ranging from some nanometers to hundreds of micrometers.

Type
Research Article
Information
MRS Bulletin , Volume 34 , Issue 12: Solid-State Ionics in the 21st Century , December 2009 , pp. 907 - 914
Copyright
Copyright © Materials Research Society 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Benninghoven, A., Rüdenauer, F.G., Werner, H.W., Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends (Wiley, New York, 1987).Google Scholar
2Vickerman, J.C., Brown, A., Reed, N.M., Eds., Secondary Ion Mass Spectrometry: Principles and Applications (Clarendon Press, Oxford, 1989).Google Scholar
3von Hevesy, G., Z. Electrochem. 26, 263 (1920).Google Scholar
4Gróh, J., von Hevesy, G., Ann. Phys. 368, 85 (1920).CrossRefGoogle Scholar
5Gróh, J., von Hevesy, G., Ann. Phys. 370, 216 (1921).CrossRefGoogle Scholar
6Freer, R., Dennis, P.F., Mineral. Mag. 45, 179 (1982).CrossRefGoogle Scholar
7Cox, B., Pemsler, J.P., J. Nucl. Mater. 28, 73 (1968).CrossRefGoogle Scholar
8Contamin, P., Slodzian, G., Compt. Rend. Sci. Paris Ser. C 267, 805 (1968).Google Scholar
9Contamin, P., Slodzian, G., Appl. Phys. Lett. 13, 416 (1968).CrossRefGoogle Scholar
10Arita, M., Hosoya, M., Kobayashi, M., Someno, M., J. Am. Ceram. Soc. 62, 443 (1979).CrossRefGoogle Scholar
11Reed, D.J., Wuensch, B.J., J. Am. Ceram. Soc. 63, 88 (1980).CrossRefGoogle Scholar
12Yamaguchi, S., Someno, M., Trans. Japan. Inst. Met. 23, 259 (1982).CrossRefGoogle Scholar
13Dubois, C., Monty, C., Philibert, J., Philos. Mag. A 46, 419 (1982).CrossRefGoogle Scholar
14Kilner, J.A., Steele, B.C.H., Ilkov, L., Solid State Ionics 12, 89 (1984).CrossRefGoogle Scholar
15Routbort, J.L., Rothman, S.J., J. Phys. Chem. Solids 47, 993 (1986).CrossRefGoogle Scholar
16Bouwmeester, H.J.M., Kruidhof, H., Burggraaf, A.J., Solid State Ionics 72, 185 (1994).CrossRefGoogle Scholar
17Adler, S.B., Chem. Rev. 104, 4791 (2004).CrossRefGoogle Scholar
18Kilner, J.A., De Souza, R.A., Fullarton, I.C., Solid State Ionics 86–88, 703 (1996).CrossRefGoogle Scholar
19De Souza, R.A., Phys. Chem. Chem. Phys. 8, 890 (2006).CrossRefGoogle Scholar
20Kilner, J.A., De Souza, R.A., in Proc. 17th Intnl. Risø Symp. On Mater. Sci., Poulsen, F.W., Bonanos, N., Linderoth, S., Mogensen, M., Zachau-Christiansen, B., Risø National Laboratory, Roskilde, Denmark (1996), p. 41.Google Scholar
21Fielitz, P., Borchardt, G., Solid State Ionics 144, 71 (2001).CrossRefGoogle Scholar
22De Souza, R.A., Chater, R.J., Solid State Ionics 176, 1915 (2005).CrossRefGoogle Scholar
23De Souza, R.A., Kilner, J.A., Solid State Ionics 106, 175 (1998).CrossRefGoogle Scholar
24Burriel, M., Garcia, G., Santiso, J., Kilner, J.A., Chater, R.J., Skinner, S.J., J. Mater. Chem. 18, 416 (2008).CrossRefGoogle Scholar
25Claus, J., Borchardt, G., Weber, S., Hiver, J.-M., Scherrer, S., Mater. Sci. Eng. B 38, 251 (1996).CrossRefGoogle Scholar
26Wang, L., Merkle, R., Maier, J., Acartürk, T., Starke, U., Appl. Phys. Lett. 94, 071908 (2009).CrossRefGoogle Scholar
27Sase, M., Yashiro, K., Sato, K., Mizusaki, J., Kawada, T., Sakai, N., Yamaji, K., Horita, T., Yokokawa, H., Solid State Ionics 178, 1843 (2008).CrossRefGoogle Scholar
28Sase, M., Hermes, F., Yashiro, K., Sato, K., Mizusaki, J., Kawada, T., Sakai, N., Yokokawa, H., J. Electrochem. Soc. 155, B793 (2008).CrossRefGoogle Scholar
29Korte, C., Peters, A., Janek, J., Hesse, D., Zakharov, N., Phys. Chem. Chem. Phys. 10, 4623 (2008).CrossRefGoogle Scholar
30Horita, T., Yamaji, K., Ishikawa, M., Sakai, N., Yokokawa, H., Kawada, T., J. Electrochem. Soc. 145, 3196 (1998).CrossRefGoogle Scholar
31Horita, T., Yamaji, K., Sakai, N., Yokokawa, H., Kawada, T., Kato, T., Solid State Ionics 127, 55 (2000).CrossRefGoogle Scholar
32Fleig, J., Phys. Chem. Chem. Phys. 11, 3144 (2009).CrossRefGoogle Scholar
33Wilson, J.R., Kobsiriphat, W., Mendoza, R., Chen, H.-Y., Hiller, J.M., Miller, D.J., Thornton, K., Voorhees, P.W., Adler, S.B., Barnett, S.A., Nat. Mater. 5, 541 (2006).CrossRefGoogle Scholar
34Harrison, L.G., Trans. Faraday Soc. 57, 1191 (1961).CrossRefGoogle Scholar
35Mondal, P., Hahn, H., Ber. Bunsen Ges. Phys. Chem. 101, 1765 (1997).CrossRefGoogle Scholar
36Guo, X., Vasco, E., Mi, S., Szot, K., Wachsman, E., Waser, R., Acta Mater. 53, 5161 (2005).CrossRefGoogle Scholar
37Kosacki, I., Rouleau, C.M., Becher, P.F., Bentley, J., Lowndes, D.H., Solid State Ionics 176, 1319 (2005).CrossRefGoogle Scholar
38De Souza, R.A., Pietrowski, M.J., Anselmi-Tamburini, U., Kim, S., Munir, Z.A., Martin, M., Phys. Chem. Chem. Phys. 10, 2067 (2008).CrossRefGoogle Scholar
39Kim, S., Avila-Paredes, H.J., Wang, S., Chen, C.T., De Souza, R.A., Martin, M., Munir, Z.A., Phys. Chem. Chem. Phys. 11, 3035 (2009).CrossRefGoogle Scholar
40Kilo, M., Taylor, M.A., Argirusis, Ch., Borchardt, G., Lesage, B., Weber, S., Scherrer, S., Scherrer, H., Schroeder, M., Martin, M., J. Appl. Phys. 94, 7547 (2003).CrossRefGoogle Scholar
41Kilo, M., Defect Diffus. Forum 242–244, 185 (2005).CrossRefGoogle Scholar
42Schulz, O., Martin, M., Argirusis, C., Borchardt, G., Phys. Chem. Chem. Phys. 5, 2308 (2003).CrossRefGoogle Scholar
43Wærnhus, I., Sakai, N., Yokokawa, H., Grande, T., Einarsrud, M.-A., Wiik, K., Solid State Ionics, 175, 69 (2004).CrossRefGoogle Scholar
44Koerfer, S., De Souza, R.A., Yoo, H.I., Martin, M., Solid State Sci. 10, 725 (2008).CrossRefGoogle Scholar
45Martin, M., Pure Appl. Chem. 75, 889 (2003).CrossRefGoogle Scholar
46Martin, M., Schmalzried, H., Ber. Bunsen Ges. Phys. Chem. 89, 124 (1985).CrossRefGoogle Scholar
47Schmalzried, H., Laqua, W., Lin, P.L., Z. Naturforsch. 34a, 192 (1979).CrossRefGoogle Scholar
48Martin, M., Solid State Ionics 136–137, 331 (2000).CrossRefGoogle Scholar
49Schmalzried, H., Laqua, W., Oxid. Met. 15, 339 (1981).CrossRefGoogle Scholar
50De Souza, R.A., Martin, M., Phys. Status Solidi C 4, 1785 (2007).CrossRefGoogle Scholar
51Schulz, O., Flege, S., Martin, M., in The Electrochemical Society Proceedings Series: SOFC–VIII, Singhal, S.C., Dokiya, M., Eds. (PV 2003–07, 2003) p. 304.Google Scholar
52Schulz, O., PhD thesis, RWTH Aachen University, Aachen, North Rhine-Westphalia, Germany (2003).Google Scholar
53Fischer, J.C., J. Appl. Phys. 22, 74 (1951).CrossRefGoogle Scholar
54De Souza, R.A., Martin, M., Phys. Chem. Chem. Phys. 10, 2356 (2008).CrossRefGoogle Scholar
55Nakagawa, T., Sakaguchi, I., Shibata, N., Matsunaga, K., Yamamoto, T., Haneda, H., Ikuhara, Y., J. Mater. Sci. 40, 3185 (2005).CrossRefGoogle Scholar
56Gomes, E., Figueiredo, F.M., Marques, F.M.B., Solid State Ionics 179, 900 (2008).CrossRefGoogle Scholar
57Litzelman, S.J., De Souza, R.A., Butz, B., Tuller, H.L., Martin, M., Gerthsen, D., J. Electroceram. 22, 263 (2009).CrossRefGoogle Scholar
58Wang, R., McIntyre, P.C., J. Appl. Phys. 97, 023508 (2005).CrossRefGoogle Scholar
59De Souza, R.A., Zehnpfenning, J., Martin, M., Maier, J., Solid State Ionics 176, 1465 (2005).CrossRefGoogle Scholar
60De Souza, R.A., Phys. Chem. Chem. Phys. 11, 9939 (2009).CrossRefGoogle Scholar
61Guo, X., Waser, R., Prog. Mater. Sci. 51, 151 (2006).CrossRefGoogle Scholar
62Meyer, R., Waser, R., Helmhold, J., Borchardt, G., Phys. Rev. Lett. 90, 105901 (2003).CrossRefGoogle Scholar