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Information: MRS Bulletin , Volume 28 , Issue 2: Single-Event Upsets in Microelectronics , February 2003 , pp. 144

DOI: https://doi.org/10.1557/mrs2003.46 [Opens in a new window]

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Volume 28, Issue 2
DOI: https://doi.org/10.1557/mrs2003.46

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