Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-17T11:46:17.777Z Has data issue: false hasContentIssue false
  • English
  • Français

Multimodal x-ray nanotomography

Published online by Cambridge University Press:  09 April 2020

Doğa Gürsoy  and
Chris Jacobsen
Doğa Gürsoy
Affiliation:
Advanced Photon Source, Argonne National Laboratory, USA; dgursoy@anl.gov
Chris Jacobsen
Affiliation:
Argonne National Laboratory, and Northwestern University, USA; cjacobsen@anl.gov
Get access

Abstract

The available x-ray brightness from accelerator-based light sources has been increasing at a rate faster than Moore’s Law. This is enabling new developments in x-ray tomography, using nanoscale x-ray beams on materials ranging in size from micrometers to centimeters. With scanning, one can record x-ray diffraction patterns to view nanoscale structure beyond the optic resolution, or fluorescence signals to study elemental distributions in three dimensions. These approaches are being used in various applications, for example, to study the redistribution of intrinsic metals in biological cells and tissues during biological processes, to compare as-fabricated versus as-designed integrated circuits, and to see the domain structure of soft ferromagnetic materials. While some applications face challenges, including radiation dose, new developments in sparse sampling and reconstruction algorithms, along with a new generation of diffraction-limited storage rings, offer exciting opportunities for materials research.

Type
Nanoscale Tomography Using X-rays and Electrons
Information
MRS Bulletin , Volume 45 , Issue 4: Nanoscale Tomography Using X-rays and Electrons , April 2020 , pp. 272 - 276
Copyright
Copyright © Materials Research Society 2020

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Jacobsen, C., X-ray Microscopy (Cambridge University Press, Cambridge, UK, 2019), p. 579.CrossRefGoogle Scholar
Yu, Z., Wang, J., Liu, Y., MRS Bull . 45 (4), 283 (2020).CrossRefGoogle Scholar
Jacobsen, C., Williams, S.P., Anderson, E., Browne, M.T., Buckley, C.J., Kern, D.P., Kirz, J., Rivers, M., Zhang, X., Opt. Commun. 86, 351 (1991).CrossRefGoogle Scholar
Eriksson, M., van der Veen, J.F., Quitmann, C., J. Synchrotron Radiat. 21 (5), 837 (2014).CrossRefGoogle Scholar
David, C., Gorelick, S., Rutishauser, S., Krzywinski, J., Vila-Comamala, J., Guzenko, V.A., Bunk, O., Färm, E., Ritala, M., Cammarata, M., Fritz, D.M., Barrett, R., Samoylova, L., Grünert, J., Sinn, H., Sci. Rep. 1, 57 (2011).CrossRefGoogle Scholar
Chapman, H.N., Barty, A., Bogan, M.J., Boutet, S., Frank, M., Hau-Riege, S.P., Marchesini, S., Woods, B.W., Bajt, S., Benner, W.H., London, R.A., Plönjes, E., Kuhlmann, M., Treusch, R., Düsterer, S., Tschentscher, T., Schneider, J.R., Spiller, E., Möller, T., Bostedt, C., Hoener, M., Shapiro, D.A., Hodgson, K.O., van der Spoel, D., Burmeister, F., Bergh, M., Caleman, C., Huldt, G., Seibert, M.M., Maia, F.R.N.C., Lee, R.W., Szöke, A., Timneanu, N., Hajdu, J., Nat. Phys. 2 (12), 839 (2006).CrossRefGoogle Scholar
Rodenburg, J.M., Faulkner, H.M., Appl. Phys. Lett. 85 (20), 4795 (2004).CrossRefGoogle Scholar
Shapiro, D.A., Yu, Y.-S., Tyliszczak, T., Cabana, J., Celestre, R., Chao, W., Kaznatcheev, K., Kilcoyne, A.L.D., Maia, F., Marchesini, S., Meng, Y.S., Warwick, T., Yang, L.L., Padmore, H.A., Nat. Photonics 8 (10), 765 (2014).CrossRefGoogle Scholar
Thibault, P., Dierolf, M., Menzel, A., Bunk, O., David, C., Pfeiffer, F., Science 321 (5887), 379 (2008).CrossRefGoogle Scholar
Ching, D.J., Hidayetoglu, M., Biçer, T., Gürsoy, D., Appl. Opt. 57 (30), 8780 (2018).CrossRefGoogle Scholar
Zhang, F., Peterson, I., Vila-Comamala, J., Diaz, A., Berenguer, F., Bean, R., Chen, B., Menzel, A., Robinson, I.K., Rodenburg, J.M., Opt. Express 21 (11), 13592 (2013).CrossRefGoogle Scholar
Vine, D.J., Pelliccia, D., Holzner, C., Baines, S.B., Berry, A., McNulty, I., Vogt, S., Peele, A.G., Nugent, K.A., Opt. Express 20 (16), 18287 (2012).CrossRefGoogle Scholar
Deng, J.J., Vine, D.J., Chen, S., Jin, Q.L., Nashed, Y.S.G., Peterka, T., Vogt, S., Jacobsen, C., Sci. Rep. 7 (1), 445 (2017).CrossRefGoogle Scholar
de Jonge, M.D., Holzner, C., Baines, S.B., Twining, B.S., Ignatyev, K., Diaz, J., Howard, D.L., Legnini, D., Miceli, A., McNulty, I., Jacobsen, C.J., Vogt, S., Proc. Natl. Acad. Sci. U.S.A. 107 (36), 15676 (2010).CrossRefGoogle Scholar
de Jonge, M.D., Kingston, A.M., Afshar, N., Garrevoet, J., Kirkham, R., Ruben, G., Myers, G.R., Latham, S.J., Howard, D.L., Paterson, D.J., Ryan, C.G., McColl, G., Opt. Express 25 (19), 23424 (2017).CrossRefGoogle Scholar
https://lightsources.org/lightsources-of-the-world.Google Scholar
Dierolf, M., Menzel, A., Thibault, P., Schneider, P., Kewish, C.M., Wepf, R., Bunk, O., Pfeiffer, F., Nature 467 (7314), 436 (2010).CrossRefGoogle Scholar
Diaz, A., Trtik, P., Guizar-Sicairos, M., Menzel, A., Thibault, P., Bunk, O., Phys. Rev. B 85 (2), 020104 (2012).CrossRefGoogle Scholar
Holler, M., Guizar-Sicairos, M., Tsai, E.H., Dinapoli, R., Muller, E., Bunk, O., Raabe, J., Aeppli, G., Nature 543 (7645), 402 (2017).CrossRefGoogle Scholar
Donnelly, C., Guizar-Sicairos, M., Scagnoli, V., Gliga, S., Holler, M., Raabe, J., Heyderman, L.J., Nature 547 (7663), 328 (2017).CrossRefGoogle Scholar
Hruszkewycz, S.O., Allain, M., Holt, M.V., Murray, C.E., Holt, J.R., Fuoss, P.H., Chamard, V., Nat. Mater. 16 (2), 244 (2017).CrossRefGoogle Scholar
Holler, M., Odstrcil, M., Guizar-Sicairos, M., Lebugle, M., Müller, E., Finizio, S., Tinti, G., David, C., Zusman, J., Unglaub, W., Bunk, O., Raabe, J., Levi, A.F.J., Aeppli, G., Nat. Electron. 2 (10), 464 (2019).CrossRefGoogle Scholar
Pfeifer, M.A., Williams, G.J., Vartanyants, I.A., Harder, R., Robinson, I.K., Nature 442 (7098), 63 (2006).CrossRefGoogle Scholar
Godard, P., Carbone, G., Allain, M., Mastropietro, F., Chen, G., Capello, L., Diaz, A., Metzger, T.H., Stangl, J., Chamard, V., Nat. Commun. 2, 568 (2011).CrossRefGoogle Scholar
Hruszkewycz, S.O., Highland, M.J., Holt, M.V., Kim, D., Folkman, C.M., Thompson, C., Tripathi, A., Stephenson, G.B., Hong, S., Fuoss, P.H., Phy. Rev. Lett. 110 (17), 177601 (2013).CrossRefGoogle Scholar
Deng, J., Lo, Y.H., Gallagher-Jones, M., Chen, S., Pryor, A. Jr., Jin, Q., Hong, Y.P., Nashed, Y.S.G., Vogt, S., Miao, J., Jacobsen, C., Sci. Adv. 4 (11), eaau4548, (2018).CrossRefGoogle Scholar
Schroer, C.G., Appl. Phys. Lett. 79 (12), 1912 (2001).CrossRefGoogle Scholar
Di, Z.W., Chen, S., Hong, Y.P., Jacobsen, C., Leyffer, S., Wild, S.M., Opt. Express 25 (12), 13107 (2017).CrossRefGoogle Scholar
Du, M., Jacobsen, C., Ultramicroscopy 184, 293 (2018).CrossRefGoogle Scholar
Wallander, H., Wallentin, J., J. Synchrotron Radiat. 24 (5), 925 (2017).CrossRefGoogle Scholar
Steinbrecht, R.A., Zierold, K., Eds., Cryotechniques in Biological Electron Microscopy (Springer-Verlag, Berlin, Germany, 1987).CrossRefGoogle Scholar
Pelz, P.M., Guizar-Sicairos, M., Thibault, P., Johnson, I., Holler, M., Menzel, A., Appl. Phys. Lett. 105 (25), 251101 (2014).CrossRefGoogle Scholar
Gürsoy, D., Opt. Lett. 42 (16), 3169 (2017).10.1364/OL.42.003169CrossRefGoogle Scholar
Kim, Y., Yoon, S., Yi, J., “Effective Sinogram-Inpainting for Metal Artifacts Reduction in X-ray CT Images,” IEEE Int. Conf. Image Proc. 597 (2010).Google Scholar
Holler, M., Raabe, J., Diaz, A., Guizar-Sicairos, M., Quitmann, C., Menzel, A., Bunk, O., Rev. Sci. Instrum. 83 (7), 073703 (2012).10.1063/1.4737624CrossRefGoogle Scholar
Wang, J., Chen, Y.-C.K., Yuan, Q., Tkachuk, A., Erdonmez, C., Hornberger, B., Feser, M., Appl. Phys. Lett. 100 (14), 143107 (2012).CrossRefGoogle Scholar
Dengler, J., Ultramicroscopy 30 (3), 337 (1989).CrossRefGoogle Scholar
Gursoy, D., Hong, Y.P., He, K., Hujsak, K., Yoo, S., Chen, S., Li, Y., Ge, M.Y., Miller, L.M., Chu, Y.S., De Andrade, V., Cossairt, O., Katsaggelos, A.K., Jacobsen, C., Sci. Rep. 7, 12, (2017).CrossRefGoogle Scholar
Odstrčil, M., Holler, M., Raabe, J., Guizar-Sicairos, M., Opt. Express 27, 25 (2019).Google Scholar
Maiden, A.M., Humphry, M.J., Rodenburg, J.M., J. Opt. Soc. Am. A 29 (8), 1606 (2012).CrossRefGoogle Scholar
Tsai, E.H.R., Usov, I., Diaz, A., Menzel, A., Guizar-Sicairos, M., Opt. Express 24 (25), 29089 (2016).CrossRefGoogle Scholar
Suzuki, A., Furutaku, S., Shimomura, K., Yamauchi, K., Kohmura, Y., Ishikawa, T., Takahashi, Y., Phys. Rev. Lett. 112 (5), 053903 (2014).CrossRefGoogle Scholar
Li, P., Maiden, A., Sci. Rep. 8 (1), 2049 (2018).CrossRefGoogle Scholar
Gilles, M.A., Nashed, Y.S.G., Du, M., Jacobsen, C., Wild, S.M., Optica 5 (9), 1078 (2018).CrossRefGoogle Scholar
Jacobsen, C., Opt. Lett. 43 (19), 4811 (2018).CrossRefGoogle Scholar