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Analysis of Cation Valences and Oxygen Vacancies in Magnetoresistive Oxides by Electron Energy-Loss Spectroscopy

Published online by Cambridge University Press:  10 February 2011

Z. L. Wang ,
J. S. Yin ,
Y. Berta  and
J. Zhang
Z. L. Wang*
Affiliation:
School of Material Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332–0245, USA.
J. S. Yin
Affiliation:
School of Material Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332–0245, USA.
Y. Berta
Affiliation:
School of Material Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332–0245, USA.
J. Zhang
Affiliation:
School of Material Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332–0245, USA.
*
a e-mail: zhong.wang@mse.gatech.edu.
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Abstract

Magnetic oxides of (La,A)MnO3 and (La,A)CoO3 have two typical structural characteristics: cations with mixed valences and oxygen vacancies, which are required to balance the charge introduced by cation doping. The consequences introduced by each can be different, resulting in different properties. It is important to quantitatively determine the percentage of charges balanced by each, but this analysis is rather difficult particularly for thin films. This paper has demonstrated that electron energy-loss spectroscopy (EELS) can be an effective technique for analyzing Mn and Co magnetic oxides with the use of intensity ratio of white lines, leading to a new technique for quantifying oxygen vacancies in functional and smart materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 494: Symposium V – Science & Technology of Magnetic Oxides , 1997 , 113
Copyright
Copyright © Materials Research Society 1998

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Footnotes

*

Advanced Technology Materials, Inc., 7 Commerce Drive, Danbury, CT 06810; Currently at: Motorola, Inc., 3501 Ed Bluestein Boulevard, MD: K-10 Austin, TX 78721.

References

REFERENCES

1. Wang, Z.L. and Kang, Z.C., Functional and Smart Materials - Structural Evolution and Structure Analysis, Plenum Press, New York, 1997.Google Scholar
2. Zener, C., Phys. Rev. 82, 403 (1951).Google Scholar
3. Egerton, R.F., Electron Energy-Loss Spectroscopy in the Electron Microscope. 2nd ed., New York: Plenum Press, 1996.Google Scholar
4. Rask, J.H., Mine, B.A. and Buseck, P.R., Ultramicroscopy 32, 319 (1987).Google Scholar
5. Pearson, D.H., Ahn, C.C. and Fultz, B., Phys. Rev. B 47, 8471 (1993).Google Scholar
6. Kurata, H. and Colliex, C., Phys. Rev. B 48, 2102 (1993).Google Scholar
7. Wang, Z.L., Yin, J.S., Jiang, Y.D. and Zhang, J., Appl. Phys. Lett. 70, 3362 (1997).Google Scholar
8. Wang, Z.L. and Yin, J.S., Phil. Mag. B, in press (1997).Google Scholar
9. Zhang, J., Gardiner, R.A., Kirlin, P.S., Boerstler, R.W. and Steinbeck, J., Appl. Phys. Lett. 61, 2884 (1992).Google Scholar
10. Wang, Z.L. and Zhang, J., Phys. Rev. B 54, 1153 (1996).Google Scholar
11. Yin, J.S. and Wang, Z.L., Microscopy and Microanalysis 3, Suppl. 2, 599 (1997).Google Scholar
12. Jin, J., Tiefel, T.H., McCormack, M., Fastnacht, R.A., Ramech, R. and Chen, L.H., Science, 264, 413 (1994).Google Scholar
13. Von Helmolt, R., Wecker, J., Holzapfel, B., Schultz, L. and Samwer, K., Phys. Rev. Lett., 71, 2331 (1994).Google Scholar
14. Lloyd, S.J., Botton, G.A. and Stobbs, W.M., J. Microsc. 180, 288 (1995).Google Scholar
15. Yuan, J., Gu, E., Gester, M., Bland, J.A.C. and Brown, L.M., J. Appl. Phys. 75, 6501 (1994).Google Scholar
16. Wang, Z.L., Yin, J.S., Mo, W.D. and Zhang, J.Z., J. Phys. Chem. B 101 (No. 35), 6793 (1997).Google Scholar