Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-08T07:30:26.675Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic Force Microscope Designs and Applications

Published online by Cambridge University Press:  21 February 2011

P. J. Bryant ,
R. G. Miller ,
R. H. Deeken  and
M. A. Pederson
P. J. Bryant
Affiliation:
Univ. of Missouri-Kansas City, Physics Department; 1110 E. 48th St.; Kansas City, MO 64110
R. G. Miller
Affiliation:
Univ. of Missouri-Kansas City, Physics Department; 1110 E. 48th St.; Kansas City, MO 64110
R. H. Deeken
Affiliation:
Univ. of Missouri-Kansas City, Physics Department; 1110 E. 48th St.; Kansas City, MO 64110
M. A. Pederson
Affiliation:
Univ. of Missouri-Kansas City, Physics Department; 1110 E. 48th St.; Kansas City, MO 64110
Get access

Abstract

Atomic force microscopes (AFM) have been designed and tested. A simple reliable version with high resolving power is described here. Materials of construction and operational parameters are reported. Applications to a range of materials has confirmed the general usefulness of AFM technology to materials research.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989 , 235
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Hansma, P.K., Elings, V.B., Marti, O., Bracker, C.E., Science, 242, 209–16 (1988).Google Scholar
2. Binnig, G., Quate, C. F. and Gerber, Ch., Phys. Rev. Lett. 56, 930 (1986).Google Scholar
3. Binnig, G., Gerber, Ch., Stoll, E., Albrecht, T.R., and Quate, C.F., Europhys. Lett. 3, 1281 (1987).CrossRefGoogle Scholar
4. Yang, R., Miller, R., and Bryant, P.J., J. Appl. Phys. 63 (2) 570–2 (1988).CrossRefGoogle Scholar
5. Bryant, P.J., Miller, R.G., and Yang, R., Appl. Phys. Lett. 52 (26) 2233–5 (1988).Google Scholar
6. Bryant, P.J., Miller, R.G., Deeken, R., Yang, R. and Zheng, Y.C., Microscopy (to be published).Google Scholar
7. Bryant, P.J., Yang, R. and Miller, R., Trans. of the 1987 MRS Natl. Symp. (1988).Google Scholar