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Atomistic study of the mechanical properties of metallic-glass nanowires

Published online by Cambridge University Press:  14 March 2011

K. Koshiyama  and
K. Shintani
K. Koshiyama
Affiliation:
Department of Mechanical Engineering and Intelligent Systems, University of Electro-Communications, 1-5-1 Chofugaoka, Chofu, Tokyo 182-8585, Japan
K. Shintani
Affiliation:
Department of Mechanical Engineering and Intelligent Systems, University of Electro-Communications, 1-5-1 Chofugaoka, Chofu, Tokyo 182-8585, Japan
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Abstract

Melt-growth simulations based on the molecular-dynamics method for both the Cu-Zr and Ni-Al crystalline nanowires of B2 structure are performed to produce metallic-glass nanowires of amorphous structure. Next, tensile deformations of these nanowires are simulated at various temperatures. For the sake of comparison, Cu-Zr and Ni-Al crystalline nanowires of B2 structure are also elongated. It is revealed that the tensile strength of the metallic-glass nanowires is third or fourth of the tensile strength of the crystalline nanowires. Increasing tensile strain, the Cu-Zr crystalline nanowires of B2 structure change their structure twice, whereas the metallic-glass nanowires only decrease their thicknesses locally, and necking takes place.

Keywords

amorphouselastic propertiesnanostructure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1297: Symposium P – Deformation Mechanisms, Microstructure Evolution and Mechanical Properties of Nanoscale Materials , 2011 , mrsf10-1297-p10-20
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Nakayama, K. S., Yokoyama, Y., Ono, T., Chen, M. W., Akiyama, K., Sakurai, T., and Inoue, A., Advanced Materials. 22, 872 (2010).Google Scholar
2. Plimpton, S. J., J. Comp. Phys. 117, 1 (1995).Google Scholar
3. Mendelev, M. I., Sordelet, D. J., and Kramer, M. J., J. Appl. Phys. 102, 043501 (2007).Google Scholar
4. Mishin, Y., Mehl, M. J., and Papaconstantopoulos, D.A., Phys. Rev. B 65, 224114 (2002).Google Scholar
5. Wang, J., Hodgson, P. D., Zhang, J., Yan, W., and Yang, C., J. Mater. Process. Technol. 209,4601(2009).Google Scholar
6. Yashiro, K., Nishimura, M., and Tomita, Y., J. Soc. Mat. Sci. 54, 1053 (2005).Google Scholar
7. Sutrakar, V. K. and Mahapatra, D. R., Mater. Lett. 63, 1289 (2009).Google Scholar
8. Cheng, Q., Wu, H. A., Wang, Y., and Wang, X. X., 95, 021911 (2009).Google Scholar
9. Sutrakar, V. K. and Mahapatra, D. Roy., Intermatallics. 18, 679 (2010).Google Scholar