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Characterization of Silver Binding in Cryptomelane by X-ray Absorption Spectroscopy

Published online by Cambridge University Press:  10 February 2011

R. Ravikumar
Affiliation:
Department of Materials Science and Mineral Engineering, University of California at Berkeley, Berkeley, CA 94720 Siemens Microelectronics Inc., 1580 Route 52, B630/Z33A, Hopewell Junction, NY 12533
D. W. Fuerstenau
Affiliation:
Department of Materials Science and Mineral Engineering, University of California at Berkeley, Berkeley, CA 94720
G. A. Waychunas
Affiliation:
Center for Materials Research, Stanford University, Stanford, CA 94305 Lawrence Berkeley National Laboratory, Earth Sciences Division, 1 Cyclotron Road, Mail Stop 90–1116, Berkeley, CA 94720
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Abstract

Using silver K-edge extended X-ray absorption fine structure (EXAFS) spectroscopy, two different samples of silver-containing manganese oxide were analyzed in the fluorescence mode. For the first sample, silver ions from solution were sorbed onto one synthetic manganese oxide phase, namely cryptomelane (KxMn8O16, where l<x<2). The second sample was a silvermanganese oxide from Colorado. From the EXAFS analysis, silver was found to occupy two different sites in the synthetic sample. The natural samples from Colorado also exhibited a very similar coordination distances as the synthetic samples. In the low temperature spectrum of the synthetic sample at 10 K, the Ag-O peak was found to be missing and the amplitude of the Ag- Ag peak was approximately three times larger than the corresponding room temperature sample.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

1. Teo, B. K., EXAFS : Basic principles and data analysis, (Springer-Verlag, New York, 1986), pp. 1182.Google Scholar
2. Brown, G. E. r. and Parks, G. A., Rev. of Geophys. 27, 519 (1989).Google Scholar
3. Pesic, B. and Wey, J. E., Trans. AIME 280, 1846 (1986).Google Scholar
4. Post, J. E., PhD thesis, Arizona State University, 1981.Google Scholar
5. Yamaguchi, T., Johansson, G., Holmberg, B., Maeda, M., and Ohtaki, H., Acta Chem. Scandinavica A 38, 437 (1984).Google Scholar
6. Dalba, G., Fornasini, P., Rocca, F., Bemieri, E., Burattini, E., and Mobilio, S., J. Non-Crystalline Solids 91, 153 (1987).Google Scholar
7. Ravikumar, R. and Fuerstenau, D. W., in Aqueous Chemistry and Geochemistry of Oxides, Oxyhydroxides, and Related Materials, edited by Voigt, J. A., Wood, T. E., B. C., Bunker, Casey, W. H., and Crossey, L. J. (Mater. Res. Soc. Proc. 432, Pittsburgh, PA, 1997) pp. 243248.Google Scholar