Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-20T11:36:35.881Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of the Degradation Processes in the Buried Heterostructure Quantum Well Laser Diodes Using Internal Second Harmonic Emission

Published online by Cambridge University Press:  21 February 2011

A. T. Lupu ,
A. V. Syrbu ,
A. Z. Mereutza ,
V. P. Yakovlev ,
I. V. Kravetsky  and
L. L. Kulyuk
A. T. Lupu
Affiliation:
Technical University of Moldova, 168 Stefan eel Mare str., Chisinau, 277012, Moldova.
A. V. Syrbu
Affiliation:
Technical University of Moldova, 168 Stefan eel Mare str., Chisinau, 277012, Moldova.
A. Z. Mereutza
Affiliation:
Technical University of Moldova, 168 Stefan eel Mare str., Chisinau, 277012, Moldova.
V. P. Yakovlev
Affiliation:
Technical University of Moldova, 168 Stefan eel Mare str., Chisinau, 277012, Moldova.
I. V. Kravetsky
Affiliation:
Institute of Applied Physics, Moldova Academy of Sciences, Academic Street 5, Chisinau, 277028, Moldova.
L. L. Kulyuk
Affiliation:
Institute of Applied Physics, Moldova Academy of Sciences, Academic Street 5, Chisinau, 277028, Moldova.
Get access

Abstract

Characterization of the degradation processes of single mode buried heterostructure quantum well laser diodes using traditional electrooptical parameters as well as the parameters of internal second harmonic radiation (SHR) were performed. In order to observe the stages of degradation process, especially in the vicinity of catastrophic optical damage of the laser mirror, single current pulses were superimposed on DC driving current. It was shown that the intensity of SHR is indicative of the laser diode mirror working regime: the bigger SHR intensity corresponds to the bigger optical power density on the mirror and the higher risk of mirror catastrophic optical damage.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 355: Symposium B1 – Evolution of Thin-Film and Surface Structure and Morphology , 1994 , 525
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Moser, A., Latta, E.E. and Webb, D.J., Appl. Phys. Lett. 55, 1152 (1989).Google Scholar
2. Fukuda, Mitsuo, Okayasu, Masanobu, Temmyo, Jiro, and Nakano, Jun-ichi, IEEE J. Quantum Electron. QE-30, 471 (1994).Google Scholar
3. Bertolotti, M., Liakhou, G., Voti, R. Li., Wang, Ruo Peng, Sibilla, C., Yakovlev, V.P.. J. Appl. Phys. 74, 7054 (1993).Google Scholar
4. Katsavetz, N.I., Kudrik, I.E., Pitkianen, P.V., presented at the 1994 SPIE Technical Conference 2148A-20”, Los Angeles, 1994 (unpublished).Google Scholar
5. Brugger, H., Epperlein, P.W., Appl.Phys. Lett. 56, 1049 (1990).Google Scholar
6. Kravetsky, I.V., Kulyuk, L.L., Lupu, A.T., Shutov, D.A., Suruceanu, G.I., Syrbu, A.V., Yakovlev, V.P., Applied Surface Science, 69, 424 (1993).Google Scholar
7. Yakovlev, V.P., Lupu, A.T., Syrbu, A.V., Suruceanu, G.I., Kravetsky, I.V., Kulyuk, L.L., Naresh Chand. presented at the 1994 SPIE Technical Conference 2148C-48', Los Angeles, 1994 (unpublished).Google Scholar
8. Yakovlev, V.P., Lupu, A.T., Syrbu, A.V., Suruceanu, G.I., Kravetsky, I.V., Kulyuk, L.L., Naresh Chand, presented at the 1994 2nd International Workshop on expert evaluation and control of compound semiconductor materials and technologies, Parma, Italy 1994 (unpublished).Google Scholar
9. Chand, Naresh, Chu, S.N.G., Dutta, N.K., Lopata, John, Geva, Michael, Syrbu, A.V. and Yakovlev, V.P., IEEE J. Quantum Electron. QE-30, 424 (1994).Google Scholar