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Compositions and Chemical Bonding in Ceramics by Quantitative Electron Energy-Loss Spectrometry

Published online by Cambridge University Press:  21 February 2011

J. Bentley ,
L.L Horton ,
C.J. Mchargue ,
S. Mckernan ,
C.B. Carter ,
A. Revcolevschi ,
S. Tanaka  and
R.F. Davis
J. Bentley
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, PO Box 2008. Oak Ridge, TN 37831-6376
L.L Horton
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, PO Box 2008. Oak Ridge, TN 37831-6376
C.J. Mchargue
Affiliation:
Now at: The University of Tennessee, Knoxville, TN 37993) Metals and Ceramics Division, Oak Ridge National Laboratory, PO Box 2008. Oak Ridge, TN 37831-6376
S. Mckernan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. SE, Minneapolis, MN 55455-0132
C.B. Carter
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. SE, Minneapolis, MN 55455-0132
A. Revcolevschi
Affiliation:
Laboratoire de Chimie des Solides. CNRS UA 446, Université Paris-Sud. Bâtiment 414. 91405 Orsay Cedex, France
S. Tanaka
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, PO Box 7907, Raleigh, NC 27695-7907
R.F. Davis
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, PO Box 7907, Raleigh, NC 27695-7907
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Abstract

Quantitative electron energy-loss spectrometry was applied to a range of ceramic materials at a spatial resolution of <5 nm. Analysis of Fe L23 white lines indicated a low-spin state with a charge transfer of ∼1.5 electrons/atom onto the Fe atoms implanted into (amorphized) silicon carbide. Gradients of 2 to 5% in the Co:O stoichiometry were measured across 100-nm-thick Co3O4 layers in an oxidized directionally solidified CoO-ZrO2 eutectic, with the highest O levels near the ZrO2. The energy-loss near-edge structures were dramatically different for the two cobalt oxides: those for Co3O4 have been incorrectly ascribed to CoO in the published literature. Kinetically stabilized solid solubility occurred in an AIN-SiC film grown by low-temperature molecular beam epitaxy (MBE) on α(6H)-SiC, and no detectable interdiffusion occurred in couples of MBE-grown AIN on SiC following annealing at up to 1750°C. In diffusion couples of polycrystalline AIN on SiC, interfacial 8H sialon (aluminum oxy-nitride) and pockets of Si3N4-rich β'sialon in the SiC were detected.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 332: Symposium U – Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy , 1994 , 385
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

1 Bentley, J., in Transmission EELS in Materials Science, edited by Disko, M.M., Ahn, C.C., and Fultz, B., (The Minerals, Metals and Materials Society, Warrendale, PA, 1992), pp. 155–181.Google Scholar
2 Bentley, J., Romana, L.J., Horton, L. L., and McHargue, C.J., in Phase Formation and Modification by Beam-Solid Interactions, edited by Was, G.S., Rehn, L.E., and Follstaedt, D.M., (Mater. Res. Soc. Proc. 235. Pittsburgh, PA, 1992) pp. 363–368.Google Scholar
3 Horton, L.L., Bentley, J., Romana, L., Perez, A., McHargue, C.J., and McCallum, J.C., Nucl. Instr. and Meth. B65, 345–351 (1992).Google Scholar
4 Bentley, J., Romana, L.J., Horton, L.L., and McHargue, C.J., in Proc. 50th Ann. Meet. Electron Microscopy Soc. Amer., edited by Bailey, G.W., Bentley, J., and Small, J.A., (San Francisco Press, San Francisco, 1992) pp. 346–7.Google Scholar
5 Dhalenne, G., d'Yvoire, F., Berthet, P., and Revcolevschi, A., Solid State lonics 63–65, 396–400 (1993).Google Scholar
6 Kern, R.S., Rowland, L.B., Tanaka, S., and Davis, R.F., Mater, J.,. Res. 8, 1477–80 (1993).Google Scholar
7 Pearson, D.H., Fultz, B., and Ahn, C.C., Appl. Phys. Lett. 53, 1405 (1988).Google Scholar
8 Morrison, T.I., Brodsky, M.N., Zaluzec, N.J., and Sill, L.R., Phys. Rev. B 32, 3107 (1988).CrossRefGoogle Scholar
9 McHargue, C.J., Perez, A., and McCallum, J.C., Nucl. Inst. and Meth. B59/60, 1362–5 (1991).Google Scholar
10 Dravid, V.P., Lyman, C.E., Notis, M.R., and Revcolevschi, A., Ultramicroscopy 29, 60–70 (1989).CrossRefGoogle Scholar
11 Bentley, J., McKernan, S., Carter, C.B., and Revcolevschi, A., Microbeam Analysis 2, S286–7 (1993).Google Scholar
12 Bentley, J., McKernan, S., Carter, C.B., and Revcolevschi, A., in EMAG'93, edited by Craven, A.J., (Institute of Physics, Bristol, UK, 1993), in press.Google Scholar
13 Bentley, J., Angelini, P., and Sklad, P.S., in Analytical Electron Microscopy 1984, edited by Williams, D.B., and Joy, D.C., (San Francisco Press, San Francisco, 1984) pp. 315–7.Google Scholar
14 Egerton, R.F., EELS in the Electron Microscope, (Plenum, New York, 1986).Google Scholar
15 Groot, F.M.F. de, Grioni, M., Fuggle, J.C., Ghijsen, J., Sawatzky, G.A., and Petersen, H., Phys. Rev. B 40, 5715–23 (1989).Google Scholar
16 Krivanek, O.L., and Paterson, J.H., Ultramicroscopy 32, 313–8 (1990).CrossRefGoogle Scholar
17 Kurata, H., and Colliex, C., Phys Rev. B 48, 2102–8 (1993).CrossRefGoogle Scholar
18 Krivanek, O.L., Disko, M.M., Tafto, J., and Spence, J.C.H., Ultramicroscopy 9, 249–254 (1982).Google Scholar
19 Tafto, J., and Krivanek, O.L, Phys. Rev. Lett. 48, 560 (1982).Google Scholar
20 Zangvil, A., and Ruh, R., Am, J.,. Ceram. Soc. 71, 884 (1988).Google Scholar
21 Chen, J., Tian, Q., and Virkar, A.V., Am, J.,. Ceram. Soc. 75, 809–21 (1992).Google Scholar
22 Bentley, J., Tanaka, S., and Davis, R.F., in EMAG'93, edited by Craven, A.J., (Institute of Physics, Bristol, UK, 1993), in press.Google Scholar
23 Jack, K.H.,. J. Mater. Sci. 11, 1135–58 (1976).CrossRefGoogle Scholar
24 McCauley, J.W. et al. , in Ceramic Microstructures '86, edited by Pask, J., and Evans, A., (Plenum, New York, 1988).Google Scholar