Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-25T20:27:37.288Z Has data issue: false hasContentIssue false

Control of a-Axis and c-AXIS Orientation of the YBa2Cu3O7−x Thin Films by Pulsed Laser Deposition

Published online by Cambridge University Press:  26 February 2011

Gun Yong Sung
Affiliation:
Electronics and Telecommunications Research Institute, P. O. Box 8, Daeduk Science Town, Daejeon, 305–606, KOREA.
Jeong Dae Suh
Affiliation:
Electronics and Telecommunications Research Institute, P. O. Box 8, Daeduk Science Town, Daejeon, 305–606, KOREA.
Kwang Yong Kang
Affiliation:
Electronics and Telecommunications Research Institute, P. O. Box 8, Daeduk Science Town, Daejeon, 305–606, KOREA.
Jeong Yong Lee
Affiliation:
Electronics and Telecommunications Research Institute, P. O. Box 8, Daeduk Science Town, Daejeon, 305–606, KOREA.
Get access

Abstract

We have investigated the effect of substrate temperatures ranging from 680 °C to 800 °C on the orientation of pulsed laser deposited YBa2Cu3O7−x.(YBCO) thin films on (100) LaAlO3 substrates. X-ray diffraction studies indicate that there is a progressive change in the dominant orientation of the films from c-axis oriented (c-axis perpendicular to the substrate surface) to a-axis oriented (a-axis perpendicular to the substrate surface) grown as the substrate temperature is lowered. Two YBCO bilayers, which are the a-axis oriented YBCO film on the top of c-axis oriented YBCO film (a/c) bilayer and c-axis oriented YBCO film on the top of a-axis oriented YBCO film (c/a) bilayer, have been grown by in situ two step pulsed laser deposition and were characterized by scanning electron microscopy (SEM), Rutherford backscattering (RBS) spectrum, x-ray diffraction (XRD), and Tc measurements. Through SEM and XRD studies, double layer structures of the a/c and c/a bilayers were confirmed indirectly.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Barner, J. B., Rogers, C. T., Inam, A., Ramesh, R., and Bersey, S., Appl. Phys. Lett. 59, 742 (1991).Google Scholar
2. Greene, L. H., Bagley, B. G., Feldmann, W. L., Barner, J. B., Shokoohi, F., Miceli, P., Wilkens, B. J., Fathy, A., Kalokitis, D., and Pendrick, V., Appl. Phys. Lett. 59, 1629 (1991).Google Scholar
3. Inam, A., Rogers, C. T., Ramesh, R., Remsching, K., Farrow, L., Hart, D., Venkatesan, T., and Wilkens, B., Appl. Phys. Lett. 57, 2484 (1990).Google Scholar
4. Eom, C. B., Marshall, A. F., Triscone, J. M., Wilkens, B., Laderman, S. S., and Geballe, T. H., Science 251, 780 (1991).Google Scholar
5. Izumi, H., Ohata, K., Hase, T., Suzuki, K., Morishita, T., and Tanaka, S., in Advances in Superconductivity IL edited by Ishiguro, T., and Kajimura, K. (Springer-Verlag, Tokyo, 1990), p. 861.Google Scholar
6. Izumi, H., Ohata, K., Sawada, T., Morishita, T., and Tanaka, S., Jpn. J. Appl. Phys. 30, 1956 (1991).Google Scholar
7. Hsieh, P. Y., Liu, J. R., and Chu, W. K., Thin, J. Solid Film (to be published).Google Scholar
8. Muenchausen, R. E., Wu, X. D., Foltyn, S., Estler, R. C., Dye, R. C., Garcia, A. R., Nogar, N. S., England, P., Ramesh, R., Hwang, D. M., Ravi, T. S., Chang, C. C., Xi, X. X., Li, Q., Inam, A., and Venkatesan, T., in Laser Ablation for Materials Synthesis, edited by Paine, D. C. and Bravman, J. C. (Mat. Res. Soc. Proc. 191, Pittsburgh, PA 1990) pp. 177182.Google Scholar
9. Ramesh, R., Chang, C. C., Ravi, T. S., Hwang, D. M., Inam, A., Xi, X. X., Li, Q., Wu, X. D., and Venkatesan, T., Appl. Phys. Lett. 57, 1064 (1990).Google Scholar