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CVD Diamond Wires as X-Ray Detectors

Published online by Cambridge University Press:  15 February 2011

C. Manfredotti ,
F. Fizzotti ,
M. Galetto ,
A. Lo Giudice ,
D. Margherita ,
C. Ongaro ,
P. Polesello  and
E. Vittone
C. Manfredotti
Affiliation:
Experimental Physics Department, University of Torino and INFN, sezione di Torino, via Giuria 1, 10125 Torino, Italy
F. Fizzotti
Affiliation:
Experimental Physics Department, University of Torino and INFN, sezione di Torino, via Giuria 1, 10125 Torino, Italy
M. Galetto
Affiliation:
Experimental Physics Department, University of Torino and INFN, sezione di Torino, via Giuria 1, 10125 Torino, Italy
A. Lo Giudice
Affiliation:
Experimental Physics Department, University of Torino and INFN, sezione di Torino, via Giuria 1, 10125 Torino, Italy
D. Margherita
Affiliation:
Experimental Physics Department, University of Torino and INFN, sezione di Torino, via Giuria 1, 10125 Torino, Italy
C. Ongaro
Affiliation:
Experimental Physics Department, University of Torino and INFN, sezione di Torino, via Giuria 1, 10125 Torino, Italy
P. Polesello
Affiliation:
Experimental Physics Department, University of Torino and INFN, sezione di Torino, via Giuria 1, 10125 Torino, Italy
E. Vittone
Affiliation:
Experimental Physics Department, University of Torino and INFN, sezione di Torino, via Giuria 1, 10125 Torino, Italy
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Abstract

Miniature metal-diamond wire detectors have been fabricated by Hot Filament Chemical Vapor Deposition (HFCVD) method and characterized as x-ray dosimeters in the energy range 50 keV–250 keV. Linearity of the response and the sensitivity as a function of energy have been accurately determined in a range routinely used for x-ray radiotherapy. With a Mo wire substrate, a 10 μm thick CVD diamond film can reach sensitivities of the order of 4×10−8 A/Gy/min, more than one order of magnitude larger than for a 6 cm3 standard ionization chamber.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 423: Symposium E – III-Nitride, SiC, and Diamond Materials for Electronic , 1996 , 81
Copyright
Copyright © Materials Research Society 1996

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References

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