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Detection of Atomic Order in Quasiamorphous Materials

Published online by Cambridge University Press:  21 February 2011

Roland S. Timsit ,
W.G. Waddington  and
C. Gallerneault
Roland S. Timsit
Affiliation:
Alcan International Ltd., Kingston R&D Centre, Kingston, ON, Canada K7L 5L9
W.G. Waddington
Affiliation:
Dept. of Astrophysics, University of Oxford, Oxford, U.K. OX1 3RH
C. Gallerneault
Affiliation:
Alcan International Ltd., Kingston R&D Centre, Kingston, ON, Canada K7L 5L9
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Abstract

The cross-correlation of intensity fields of different regions of an HREM micrograph can identify regions of structural order in an apparendy random matrix. This paper presents results of cross-correlations on computer-simulated HREM images of a diin Si crystallite located on a relatively thick slab of amorphous Si. These simulations confirm the efficacy of cross-correlations in retrieving atomic order from die image of an apparently amorphous material and thus confirm the interpretation of experimental results obtained earlier.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 258: Symposium A – Amorphous Silicon Technology – 1992 , 1992 , 257
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

[1] Fan, G.Y., and Cowley, J.M., Ultramicroscopy, 17, 345 (1985).Google Scholar
[2] Frank, J., in “Computer Processing of Electron Microscope Images” Ed. Hawkes, P.W., (Springer, New York, 1980) p. 187.Google Scholar
[3] Timsit, R.S., Gallerneault, C., Barry, J.C. and Landheer, D., Appl. Phys. Letters, 53, 28 (1988).Google Scholar
[4] Goodman, P., and Moodie, A.F., Acta Cryst., A30, 280 (1974).Google Scholar
[5] Ishizuka, K., and Uyeda, N., Acta Cryst., A33, 740 (1977).Google Scholar
[6] Self, P.G., and O'Keefe, M.A., in High Resolution Transmission Electron Microscopy and Associated Techniques, Eds. Buseck, P., Cowley, J.M., and Eyring, L., (Oxford University Press, New York, 1988), p. 244.Google Scholar
[7] Timsit, R.S., Waddington, W.G. and Gallerneault, C., Ultramicroscopy, in press (1992).Google Scholar