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Domain Topology of Micron-Scale, Ferromagnetic Pancakes

Published online by Cambridge University Press:  15 February 2011

Peter J. Bedrossian ,
Matthew R. Gibbons  and
Charles J. Cerjan
Peter J. Bedrossian
Affiliation:
Lawrence Livermore National Laboratory, Livermore CA 94551
Matthew R. Gibbons
Affiliation:
Lawrence Livermore National Laboratory, Livermore CA 94551
Charles J. Cerjan
Affiliation:
Lawrence Livermore National Laboratory, Livermore CA 94551
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Abstract

Planar, micron-scale ellipses patterned from 700Å-thick Co films exhibit nearly-complete suppression of hysteresis when magnetized in-plane along their short axes. Using a combination of Magnetic Force Microscopy and Vibrating Sample Magnetometry, we find that the suppression of hysteresis is associated with the continuous deformation of a dipole field configuration. The presence of hysteresis for in-plane, long-axis magnetization is associated with transitions between topologically inequivalent configurations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 475: Symposium M – Magnetic Ultrathin Films, Multilayers, and Surfaces – 1997 , 1997 , 277
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

1. New, R., Pease, R., and White, R., Magnetism, J. and Magnetic Materials 155, 140 (1996); J. Vac. Sci. Technol. B 13, 1089 (1995).Google Scholar
2. van den Berg, H., J. Appl Phys. 57, 2168 (1985).Google Scholar
3. Hehn, M. et al., Science 272, 1782 (1996); J. Appl. Phys. 79, 5068 (1996).Google Scholar
4. Gibson, G. and Schultz, S., J. Appl. Phys 73, 4516 (1993).Google Scholar
5. Smyth, J. et al, J. Appl. Phys. 69, 5262 (1991); J. Appl. Phys. 63, 4237 (1988).Google Scholar
6. Chou, S., Wei, M., Krauss, P., and Fischer, P., J. Appl. Phys. 76, 6673 (1994).Google Scholar
7. Gomez, R. et al, J. Appl. Phys. 80, 342 (1996).Google Scholar
8. Fredkin, D. and Koehler, T., J. Appl. Phys. 67, 5544 (1990).Google Scholar
9. Manalis, S., Babcock, K., Massie, J., Elings, V., and Dugas, M., Appl. Phys. Lett. 66, 2585 (1995).Google Scholar
10. Wernsdorfer, W., et al, Phys. Rev. B 53, 3341 (1996).Google Scholar
11. Landau, L., Lifshitz, E., and Pitaevskii, L., Electrodynamics of Continuous Media (Pergamon, Elmsford NY, 1984), pp. 157–9.Google Scholar
12. Kittel, C. and Galt, J., in Solid State Physics 3, edited by Seitz, F. and Tumbull, D. (Academic, NY, 1956), p. 439.Google Scholar
13. Mermin, N. D., Rev. Mod. Phys. 51, 591 (1979).Google Scholar
14. Kleman, M., in Formation and Interaction of Topological Defects, edited by Davis, A. and Brandenberger, R. (Plenum, NY, 1995), p. 27.Google Scholar
15. Osborn, J., Phys. Rev. 67, 351 (1945).Google Scholar
16. Babcock, K., Dugas, M., Manalis, S., and Elings, V., in Evolution of Thin-Film and Surface Structure and Morphology, edited by Demczyk, B. et al., MRS Symposium Proceedings Vol. 355 (MRS, Pittsburgh, 1995).Google Scholar