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Extended D.C. Electrical Transport Measurements on the Mixed Conductor Cu3Cs2

Published online by Cambridge University Press:  10 February 2011

P. K. Lemaire
Affiliation:
Central Connecticut State University, New Britain CT 06050
J. Benoit
Affiliation:
Central Connecticut State University, New Britain CT 06050 United Technlogies Research Center, East Hartford CT 06108
R. Speel
Affiliation:
Greenwich Air Services, East Granby CT 06026
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Abstract

D.C. electrical transport measurements have been done over the temperature range 200 K. to 450 K on the mixed conductor Cu3.0CS2 This work extends the original work done on CuxCS2 over the temperature range 260 K to 350 K. Above 220 K, the voltage versus time curves follow the Yokota model for mixed conductors. Below 220K, the voltage versus time curves were practically constant, suggesting very little ionic transport below this temperature, and an electronic conductivity of the order of 10−5 (Ω cm)−1 at 200 K. At ambient temperatures, the ionic conductivity and electronic conductivity were both of the order of 10−3 (Ω cm)−1, and the chemical diffusion coefficient found to be of the order of 10−6 cm2s−1, in agreement with earlier work on Cu3CS2. Above 220 K, the ionic conductivity versus temperature plots were of the Arrhenius form with an activation energy of about 0.36 eV. The jump time and residence time were estimated to be of the order of 10−12s and 10−6s respectively, confirming hopping as the mode of ionic transport. The electronic conductivity versus temperature plot confirmed thermal activation as the mode of electronic transport. The results suggest CuxCS2 to be very stable and the Yokota model, with very little modification, to be very reliable for the analysis of these mixed conductors.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

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