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Film Softening Effects of ZrO2 on MoSi2

Published online by Cambridge University Press:  25 February 2011

C. M. Czarnik ,
R. Gibala ,
M. Nastasi  and
J. D. Garrett
C. M. Czarnik
Affiliation:
The University of Michigan, Department of Materials Science and Engineering, Ann Arbor, MI 48109-2136
R. Gibala
Affiliation:
The University of Michigan, Department of Materials Science and Engineering, Ann Arbor, MI 48109-2136
M. Nastasi
Affiliation:
Materials Science Technology Div., Los Alamos National Laboratory, Los Alamos, NM 87545
J. D. Garrett
Affiliation:
Institute for Materials Research, McMaster University, Hamilton ONT, Canada, L8S 4M1
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Abstract

We have investigated the effect of thin films of ZrO2 on the mechanical behavior of [001] single-crystalline MoSi2. Previous work in our laboratories has shown there to be a 20-40% reduction in hardness in coated samples relative to the corresponding uncoated samples. We now compare fracture around the indentations as a function of thickness. Thicker ZrO2 coatings reduce radial crack length around the indentation through the intrinsic compressive stress at the film/substrate interface. In addition, ZrO2-coated materials tested in compression at 1250°C exhibit approximately twice the plastic strain of uncoated materials, indicating that reduction in hardness is associated with enhanced plasticity from dislocation activity associated with the film/substrate interface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 322: Symposium F – High-Temperature Silicides and Refractory Alloys , 1993 , 185
Copyright
Copyright © Materials Research Society 1994

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References

1. Vasudevan, A.K. and Petrovic, J.J., Mater. Sci. Eng. A155, 1 (1992).Google Scholar
2. Noebe, R.D. and Gibala, R., Structure and Deformation of Boundaries, Subramanian, K. and Iman, M.S., eds., TMS-AIME, Warrendale, PA, p. 89, 1986.Google Scholar
3. Petrovic, J.J., Bhattacharya, A.K., Honnell, R.E., Mitchell, T.E., Wade, R.K. and McClellan, K.J., Mater. Sci. Eng. A155, 259 (1992).Google Scholar
4. Czarnik, C.M., Gibala, R., Nastasi, M.A., Schwarz, R.B., Srinivasan, S.R. and Petrovic, J.J., Mat. Res. Soc., 288 (1993).Google Scholar
5. Umakoshi, Y., Hirano, T., Sakagami, T. and Yamane, T., Scripta Metall. 23, 87 (1989).Google Scholar
6. Scheuerman, R., Stresses in Dielectric Films, Thin Film Dielectrics, Vratny, F. ed., 561 (1969).Google Scholar
7. Hoffman, R. W., Physics of Thin Films, Vol. 3. Academic Press, New York, (1966).Google Scholar
8. Chiang, S.S., Marshall, D.B. and Evans, A.G., J. Appl. Phys. 53, 298 (1982).Google Scholar