Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-18T10:29:15.972Z Has data issue: false hasContentIssue false

Fluorinated, Low Thermal Expansion Coefficient Polyimides For Interlayer Dielectric Application: Thermal Stability, Refractive Index And High Temperature Modulus Measurements

Published online by Cambridge University Press:  15 February 2011

Brian C. Auman*
Affiliation:
DuPont Electronic Materials, Experimental Station, E334/27, Wilmington, DE 19880
Get access

Abstract

The mechanical, thermal, electrical and moisture absorption properties of rod-like, fluorinated polyimides and copolyimides developed in our laboratory are briefly reviewed. Further characterization work on the most promising candidates for interlayer dielectric applications is reported. This includes in- and out-of-plane refractive index measurements to estimate the isotropy of the dielectric constant, isothermal TGA measurements to assess thermal stability at processing temperatures and dynamic-mechanical analysis to ascertain the glass transition temperature and the mechanical modulus at temperatures in excess of the glass transition

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Feiring, A. E., Auman, B. C., and Wonchoba, E. R., Polym. Prepr., 34(1), 393 (1993); Macromolecules, 26, 2779 (1993).Google Scholar
2. Auman, B. C.,, Proc. of the 4th Intl. Conf. on Polyimides, Ellenville, NY, Oct. 30 - Nov. 1, 1991. p. 15; S. Trofimenko, Proc. of the 4th Intl. Conf. on Polyimides Ellenville, NY Oct. 30 - Nov. 1, 1991. p. 1–3; also in ”Advances in Polyimide Science and Technology “, edited by Feger, C., Khojasteh, M., and Htoo, M. (Technomic Publishing, Lancaster PA, 1993), p. 3 and p.15.Google Scholar
3. Auman, B. C., Society of Plastic Engineers, Annual Technical Conference (ANTEC), New Orleans, LA, May 9–13, 1993, Book of Preprints, p. 1328 (1993).Google Scholar
4. Auman, B. C., in Advanced Metallization for Devices and Circuits-Science Technology and Manufacturability, edited by Murarka, S. P., Katz, A., Tu, K. N., and Maex, K. (Mater. Res. Soc. Proc. 337, Pittsburgh, PA, 1994) pp. 705714.Google Scholar
5. Auman, B. C., presented at the First International Conference on Dielectrics and CMP for VLSI/ULSI Multilevel Interconnection, Feb. 20–22, 1995, Santa Clara, CA, Proceedings Booklet p. 297.Google Scholar
6. Leu, J., Lee, J. K., Kasthurirangan, J., Liao, C. N. and Ho, P.S., presented at the SRC Topical Research Conference on Low Dielectric Constant Interlayer Dielectrics for High Performance Circuits, August 9–10, 1994, Rensselaer Polytechnic Institute, Rensselaer, NY.Google Scholar
7. Buchwalter, P., Farris, R., Ho, P., Leu, J., private communications.Google Scholar
8. Coburn, J.C. and Pottiger, M. T. in ”Advances in Polyimide Science and Technology”;, Feger, C., Khojasteh, M., and Htoo, M., Eds., Technomic Publ., Lancaster, PA, p. 360. (1993), presented at the 4th Intnl. Conf. on Polyimides, Ellenville, NY. Oct. 1991.Google Scholar
9. Leu, J., Ho, P., Auman, B. C., et al. (unpublished results).Google Scholar
10. Coburn, J.C., Pottiger, M.T. and Pryde, C.A., Mat. Res. Soc. Proc. 308, 475 (1993).Google Scholar
11. Coburn, J. C., Soper, P. D., and Auman, B. C., Macromolecules 28, 3253 (1995).Google Scholar