Hostname: page-component-6bf8c574d5-l72pf Total loading time: 0 Render date: 2025-03-07T02:37:13.247Z Has data issue: false hasContentIssue false
  • English
  • Français

Formation of Microtwins in Low Angle Grain Boundaries in Germanium

Published online by Cambridge University Press:  22 February 2011

Z. Elgat  and
C. B. Carter
Z. Elgat
Affiliation:
Department of Materials Science and Engineering, Bard Hall, Cornell University, Ithaca, NY 14853
C. B. Carter
Affiliation:
Department of Materials Science and Engineering, Bard Hall, Cornell University, Ithaca, NY 14853
Get access

Abstract

The structure of a low angle tilt boundary with a [110] misorientation axis and a (111) initial boundary plane in a bicrystal prepared by a hot-pressing technique has been studied. The boundary consists of a periodic array of dislocations as expected but contains a new feature, namely microtwins which lie parallel to the boundary plane. High resolution transmission electronmicroscopy has been used to characterize the boundary structure and to determine the Burgers vector of the dislocations present. The relationship between the structure of the twin-free regions and the twinned regions is discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 25: Symposium C – Thin Films and Interfaces II , 1983 , 293
Copyright
Copyright © Materials Research Society 1984

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Bourret, A. and Desseux, J., Phil. Mag. 39, 405, 419 (1979).Google Scholar
2. Carter, C. B., Rose, J. and Ast, D. G., Inst. Phys. Conf. Ser. 60, 153 (1981).Google Scholar
3. Cunningham, B. and Ast, D. G., Proc. 41st Ann. Meeting CMSA, 114 (1983).Google Scholar
4. Carter, C. B. in Grain Boundaries in Semiconductors (North-Holland) 33-38 (1982).Google Scholar
5. Bourret, A., Desseaux, J. and Renault, A., Phil. Mag. A45, 1 20 (1982).CrossRefGoogle Scholar
6. Skrotski, W., Wendt, H., Carter, C. B. and Kohlstedt, D. L. (these proceedings).Google Scholar
7. Goodhew, P. J., Tan, T. Y. and Balluffi, R. W., Acta. Met. 26, 557 (1978).CrossRefGoogle Scholar
8. Clarebrough, L. M. and Forword, C. T., Proc. 9th Int. Conf. on Electron Microscopy, Toronto, pp. 380-391 (1978).Google Scholar
9. Morrissey, K. J. and Carter, C. B., Advances in Ceramics 12, in press (1983).Google Scholar
10. Gleiter, H., Acta. Met. 17, 1421 (1969).Google Scholar
11. Pond, and Smith, , Phil. Mag. 36, No. 2, 353 (1977).Google Scholar
12. Hirth, J. P. and Balluffi, R. W., Acta. Met. Rev. 21 (1973).Google Scholar
13. Föll, H., Phys. Stat. Sol. (a) 69, 779 (1982).Google Scholar
14. Smith, D. A. and Goodhew, P. J., Phil. Mag. A46, 161 169 (1982).Google Scholar