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Formation of New Interfacial Phases in Bimetallic Thin Film Couples Studied by in Situ Annealing X-ray Diffraction

Published online by Cambridge University Press:  26 February 2011

J. M. Vandenberg
J. M. Vandenberg*
Affiliation:
AT & T Bell Laboratories, Murry Hill, NJ 07974
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Abstract

Interfacial reactions in bimetallic thin films have been studied by in-situ glancing angle X-ray diffraction which enables us to monitor all stages of the interface reaction in the temperature range 35 °-950° C Results are presented on new phase formation in evaporated Ag-Al and Cu-Al thin film couples, sputtered bimetallic Nb-Sn and Nb-Pb films and magnetic alloy films. New phases as well as phase transitions which are not known to exist in the bulk phase diagrams, were observed. These results provided evidence that phases other than those predicted by the first nucleation rule, grow during the initial metal-metal thin film interface reaction.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 54: Symposium E – Thin Films–Interfaces and Phenomena , 1985 , 171
Copyright
Copyright © Materials Research Society 1986

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References

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