Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-25T19:29:29.074Z Has data issue: false hasContentIssue false
  • English
  • Français

Giant Magnetoresistance in Annealed Fe/Cr Multilayers

Published online by Cambridge University Press:  03 September 2012

Noa More Rensing  and
Bruce M. Clemens
Noa More Rensing
Affiliation:
Department of Applied Physics, Stanford University, Stanford CA 94305
Bruce M. Clemens
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford CA 94305
Get access

Abstract

The giant magnetoresistance effect in antiferromagnetically coupled Fe/Cr Multilayers has been attributed to spin dependent scattering at the interfaces between the constituents. One possible source of this spin dependent scattering is chromium impurities in the iron layers due to intermixing at the interfaces. Annealing the films can promote the diffusion of the components, increasing the impurity concentration and therefore the Magnetoresistance. For this study Fe/Cr Multilayers were annealed at several temperatures and for several durations. Annealing at moderate temperatures (∼ 350°C) increases the Magnetoresistance, while higher temperature anneals (∼ 600°C) cause the magnetoresistance to disappear completely. Long anneals at 330°C (> 100 hours) also reduce the Magnetoresistance. VSM Measurements indicate that the antiferromagnetic coupling is reduced in the annealed samples but show no evidence of Magnetically “dead” alloy layers. Low angle X-ray diffraction indicates that the structural effect of annealing is very subtle in comparison to the significant magnetic effect.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 313: Symposium Q1 – Magnetic Ultrathin Films, Multilayers and Surfaces/Magnetic Interfaces-Physics and Characterizations , 1993 , 197
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Baibich, M. N., Broto, J. M., Fert, A., Dau, F. N. V., Petroff, F., Etienne, P., Creuzet, G., Friedrich, A., and Chazelas, J.. Phys. Rev. Lett, 61: 2472–2475, 1988.Google Scholar
2. Camley, R. E. and Barnás, J.. Phys. Rev. Lett, 63:664–667, 1989.Google Scholar
3. Levy, P., Zhang, S., and Fert, A.. Phys. Rev. Lett., 65:1643–1646, 1990.Google Scholar
4. Johnson, B. and Camley, R. E.. Phys. Rev. B., 44:9997–1002, 1991.Google Scholar
5. Bruno, P. and Chappert, C.. Phys. Rev. B, 46:261–70, 1992.Google Scholar
6. Baumgart, P., Gurney, B. A., Wilhoit, D. R., Nguyen, T., Dieny, B., and Speriosu, V. S.. J. Appl. Phys., 69:4792–4794, 1991.Google Scholar
7. Petroff, F., Barthélé, A., Hamzic, A., Fert, A., Etienne, P., Lequien, S., and Creuzet, G.. J. Mag. Mag. Mat, 93:95–100, 1991.Google Scholar
8. Fullerton, E. E., Kelly, D. M., Guimpel, J., Schuller, I. K., and Bruynseraede, Y.. Phys. Rev. Lett, 68:859–62, 1992.Google Scholar
9. Parkin, S. S. P., Bhadra, R., and Roche, K. P.. Phys. Rev. Lett, 66:2152–5, 1991.Google Scholar
10. Rensing, N., Payne, A., and Clemens, B.. J. Mag. Mag. Mat, 121:436–439, 1993.Google Scholar