Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-20T02:36:33.473Z Has data issue: false hasContentIssue false

Giant Magnetoresistance in Single Layer and Multilayer Phase Separating Alloy Films

Published online by Cambridge University Press:  03 September 2012

S. Hossain
Affiliation:
The University of Alabama, Department of Electrical Engineering and Tuscaloosa, AL 35487–0202
A. Waknis
Affiliation:
The University of Alabama, Department of metallurgical and Materials Engineering, Tuscaloosa, AL 35487–0202
D. Seale
Affiliation:
The University of Alabama, Department of Electrical Engineering and Tuscaloosa, AL 35487–0202
M. Tan
Affiliation:
The University of Alabama, Department of metallurgical and Materials Engineering, Tuscaloosa, AL 35487–0202
M.R. Parker
Affiliation:
The University of Alabama, Department of Electrical Engineering and Tuscaloosa, AL 35487–0202
J.A. Barnard
Affiliation:
The University of Alabama, Department of metallurgical and Materials Engineering, Tuscaloosa, AL 35487–0202
Get access

Abstract

The phenomenon of giant magnetoresistance (GMR), previously measured only in multilayer films comprising ferromagnetic layers separated by nonmagnetic spacers, has recently been observed in single layer ‘granular’ alloy thin films prepared by cosputtering a ferromagnet and a nonmagnet which tend to phase separate (cluster) under equilibrium conditions. We have systematically studied the magnetoresistance of two new phase separating GMR systems (Ni66Fe16Co18-Ag and Co9oFelo-Ag) both of which exhibit large room temperature GMR (>11% and >14%, respectively). We have also attempted to influence the details of the field dependence of the magnetoresistance in the previously studied Co-Ag system by employing novel processing methods including interrupted sputtering and layering of the Co-Ag alloy with Cu spacers.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Barnard, J.A., Waknis, A., Tan, M., Haftek, E., Parker, M.R., and Watson, M.L., J. Mag. Mag. Mat. 114, L230 (1992).Google Scholar
[2] Barnard, J.A., Hossain, S., Parker, M.R., Waknis, A., and Watson, M.L., J. Appl. Phys., in press.Google Scholar
[3] Watson, M.L., Barnard, J.A., Hossain, S., and Parker, M.R., J. Appl. Phys., in press.Google Scholar
[4] Berkowitz, A.E., Mitchell, J.R., Carey, M.J., Young, A.P., Zhang, S., Spada, F.E., Parker, F.T., Hutten, A., and Thomas, G., Phys. Rev. Lett. 68, 3745 (1992).Google Scholar
[5] Xiao, J.Q., Jiang, J.S., and Chien, C.L., Phys. Rev. Lett. 68, 3749 (1992).Google Scholar
[6] Jiang, J.S., Xiao, J.Q., and Chien, C.L., Appl. Phys. Lett. 61, 2362 (1992).Google Scholar
[7] Jimbo, M., Kanda, T., Goto, S., Tsunashima, S., and Uchiyama, S., Jpn. J. Appl. Phys. 31, L1348 (1992).Google Scholar
[8] Barnard, J.A., Parker, M.R., Seale, D., and Yang, J., submitted IEEE TRANS. MAG.Google Scholar
[9] Saito, Y. and Inomata, K., Jpn. J. Appl. Phys. 30, L1333 (1991).Google Scholar